scholarly journals Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precursors for the Bottom-Up Approach of Nanoscaled Devices

2014 ◽  
Vol 86 (12) ◽  
pp. 5740-5748 ◽  
Author(s):  
Markus Holzweber ◽  
Thomas Heinrich ◽  
Valentin Kunz ◽  
Sebastian Richter ◽  
Christoph H.-H. Traulsen ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Principal Component Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Principal Component ◽  
Component Analysis ◽  
Self Assembled Monolayers ◽  
Tof Sims ◽  
Assembled Monolayers ◽  
Secondary Ion

Time-of-Flight Secondary Ion Mass Spectrometry with Principal Component Analysis of Titania–Blood Plasma Interfaces

Langmuir ◽  
2012 ◽  
Vol 29 (3) ◽  
pp. 902-912 ◽  
Author(s):  
Ricardo Tejero ◽  
Peggy Rossbach ◽  
Beat Keller ◽  
Eduardo Anitua ◽  
Ilya Reviakine
Keyword(s):  
Mass Spectrometry ◽  
Principal Component Analysis ◽  
Blood Plasma ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Principal Component ◽  
Component Analysis ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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