Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces

Yiu-Ting R. Lau; Lu-Tao Weng; Kai-Mo Ng; Chi-Ming Chan

doi:10.1021/ac902280h

Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces

Analytical Chemistry ◽

10.1021/ac902280h ◽

2010 ◽

Vol 82 (7) ◽

pp. 2661-2667 ◽

Cited By ~ 17

Author(s):

Yiu-Ting R. Lau ◽

Lu-Tao Weng ◽

Kai-Mo Ng ◽

Chi-Ming Chan

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Analysis Determination

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Maximum likelihood principal component analysis of time-of-flight secondary ion mass spectrometry spectral images

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1861935 ◽

2005 ◽

Vol 23 (4) ◽

pp. 746-750 ◽

Cited By ~ 14

Author(s):

Michael R. Keenan

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Maximum Likelihood ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis

Applied Surface Science ◽

10.1016/j.apsusc.2015.07.066 ◽

2015 ◽

Vol 355 ◽

pp. 842-848 ◽

Cited By ~ 12

Author(s):

Damien Cossement ◽

Fabian Renaux ◽

Damien Thiry ◽

Sylvie Ligot ◽

Rémy Francq ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Polymer Films ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Plasma Polymer ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Determination of spatial distribution of alloying and impurity elements in zircaloy using imaging secondary ion mass spectrometry and principal component analysis

Vacuum ◽

10.1016/j.vacuum.2016.11.015 ◽

2017 ◽

Vol 136 ◽

pp. 1-9 ◽

Cited By ~ 2

Author(s):

V. Karki ◽

R. Agarwal ◽

D. Alamelu

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Spatial Distribution ◽

Secondary Ion Mass Spectrometry ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Impurity Elements ◽

Secondary Ion

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Time-of-Flight Secondary Ion Mass Spectrometry with Principal Component Analysis of Titania–Blood Plasma Interfaces

Langmuir ◽

10.1021/la303360f ◽

2012 ◽

Vol 29 (3) ◽

pp. 902-912 ◽

Cited By ~ 15

Author(s):

Ricardo Tejero ◽

Peggy Rossbach ◽

Beat Keller ◽

Eduardo Anitua ◽

Ilya Reviakine

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Blood Plasma ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Analysis of Ink/Coating Penetration on Paper Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) in Conjunction with Principal Component Analysis (PCA)

The Journal of Adhesion ◽

10.1080/00218460801954474 ◽

2008 ◽

Vol 84 (3) ◽

pp. 277-292 ◽

Cited By ~ 10

Author(s):

R. N. S. Sodhi ◽

L. Sun ◽

M. Sain ◽

R. Farnood

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Improvement of sensitivity using principal component analysis by dual focused ion beam time-of-flight secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.078 ◽

2008 ◽

Vol 255 (4) ◽

pp. 1052-1054 ◽

Cited By ~ 2

Author(s):

Yoshihiro Morita ◽

Masanori Owari

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of Adsorbed Protein Films by Time-of-Flight Secondary Ion Mass Spectrometry with Principal Component Analysis

Langmuir ◽

10.1021/la001209t ◽

2001 ◽

Vol 17 (15) ◽

pp. 4649-4660 ◽

Cited By ~ 312

Author(s):

M. S. Wagner ◽

David G. Castner

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Protein Films ◽

Adsorbed Protein ◽

Secondary Ion

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Differentiation between Single Bladder Cancer Cells Using Principal Component Analysis of Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac504684n ◽

2015 ◽

Vol 87 (6) ◽

pp. 3195-3201 ◽

Cited By ~ 14

Author(s):

Justyna Gostek ◽

Kamil Awsiuk ◽

Joanna Pabijan ◽

Jakub Rysz ◽

Andrzej Budkowski ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Bladder Cancer ◽

Cancer Cells ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Bladder Cancer Cells ◽

Secondary Ion

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Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precursors for the Bottom-Up Approach of Nanoscaled Devices

Analytical Chemistry ◽

10.1021/ac500059a ◽

2014 ◽

Vol 86 (12) ◽

pp. 5740-5748 ◽

Cited By ~ 9

Author(s):

Markus Holzweber ◽

Thomas Heinrich ◽

Valentin Kunz ◽

Sebastian Richter ◽

Christoph H.-H. Traulsen ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Self Assembled Monolayers ◽

Tof Sims ◽

Assembled Monolayers ◽

Secondary Ion

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