Metal-Oxide Decorated Multilayered Three-Dimensional (3D) Porous Carbon Thin Films for Supercapacitor Electrodes

2016 ◽  
Vol 55 (49) ◽  
pp. 12569-12581 ◽  
Author(s):  
Kunal Mondal ◽  
Rudra Kumar ◽  
Ashutosh Sharma
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Porous Carbon ◽  
Three Dimensional ◽  
Carbon Thin Films

Porous carbon thin films for electrochemical capacitors

Carbon ◽  
2013 ◽  
Vol 64 ◽  
pp. 456-463 ◽  
Author(s):  
Zoran Laušević ◽  
Pavel Yu. Apel ◽  
Jugoslav B. Krstić ◽  
Irina V. Blonskaya
Keyword(s):  
Thin Films ◽  
Porous Carbon ◽  
Electrochemical Capacitors ◽  
Carbon Thin Films

scholarly journals 2D and 3D Analyses of Metal Oxide Thin Films Examined by Atomic Force Microscope

2015 ◽  
Vol 773-774 ◽  
pp. 716-719
Author(s):  
Mokhter Faezahana ◽  
Nayan Nafarizal ◽  
Jia Wei Low ◽  
Che Ani Norhidayah ◽  
Mohd Zainizan Sahdan ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Metal Oxide ◽  
Three Dimensional ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Oxide Thin Films ◽  
Metal Oxide Thin Films ◽  
Atomic Force ◽  
Measured Sample

Atomic force microscope (AFM) is a useful tool to capture the two- and three-dimensional image of height and size of nanostructured thin film. It operate by measuring the forces between a sharp tip and surface of the measured sample. In addition, AFM is equipped with powerful software for image processing to interpret experimental results in detail. For example, by using the height and scanning length parameters of measured sample, average roughness and root mean square roughness can be evaluated. In the present works, the effect of image flattening process toward the surface roughness and surface fluctuations of metal oxide thin films will be presented. Set of samples were prepared by magnetron sputtering deposition and sol-gel coating techniques. In gas sensor industries using metal oxide thin film, surface roughness of metal oxide thin films are very important in order to improve the sensitivity and respond time of gas sensor. Therefore, optimization of thin film deposition and characterization are very important. The correlation between the three-dimensional image and thin film deposition and image processing parameters will also be presented.

Facile Synthesis of Metal-Loaded Porous Carbon Thin Films via Carbonization of Surface-Mounted Metal–Organic Frameworks

2017 ◽  
Vol 56 (6) ◽  
pp. 3526-3531 ◽  
Author(s):  
Zhi-Gang Gu ◽  
De-Xiang Zhang ◽  
Wen-Qiang Fu ◽  
Zhi-Hua Fu ◽  
M. Ismail Vohra ◽  
...  
Keyword(s):  
Thin Films ◽  
Porous Carbon ◽  
Metal Organic Frameworks ◽  
Facile Synthesis ◽  
Metal Organic ◽  
Carbon Thin Films

Production of porous carbon thin films by pulsed laser deposition

1999 ◽  
Vol 350 (1-2) ◽  
pp. 49-52 ◽  
Author(s):  
D Vick ◽  
Y.Y Tsui ◽  
M.J Brett ◽  
R Fedosejevs
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Porous Carbon ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Carbon Thin Films

Study of porous carbon thin films produced by pulsed laser deposition

2007 ◽  
Vol 253 (19) ◽  
pp. 7964-7968 ◽  
Author(s):  
R. Janmohamed ◽  
J.J. Steele ◽  
C. Scurtescu ◽  
Y.Y. Tsui
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Porous Carbon ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Carbon Thin Films

Investigation of superfast deposition of metal oxide and Diamond-Like Carbon thin films by nanosecond Ytterbium (Yb+) fiber laser

2013 ◽  
Vol 36 (1) ◽  
pp. 53-59 ◽  
Author(s):  
V. Serbezov ◽  
S. Sotirov ◽  
K. Benkhouja ◽  
A. Zawadzka ◽  
B. Sahraoui
Keyword(s):  
Thin Films ◽  
Metal Oxide ◽  
Fiber Laser ◽  
Diamond Like Carbon ◽  
Carbon Thin Films

Electron energy loss spectroscopy of diamond-like carbon thin films

1992 ◽  
Vol 50 (2) ◽  
pp. 1272-1273
Author(s):  
J. Kulik ◽  
Y. Lifshitz ◽  
G.D. Lempert ◽  
S. Rotter ◽  
J.W. Rabalais ◽  
...  
Keyword(s):  
Thin Films ◽  
Energy Loss ◽  
Electron Energy ◽  
Ion Beam ◽  
Diamond Like Carbon ◽  
Ion Beam Deposition ◽  
Chemistry Research ◽  
Carbon Thin Films ◽  
Electron Energy Loss ◽  
Beam Deposition

Carbon thin films with diamond-like properties have generated significant interest in condensed matter science in recent years. Their extreme hardness combined with insulating electronic characteristics and high thermal conductivity make them attractive for a variety of uses including abrasion resistant coatings and applications in electronic devices. Understanding the growth and structure of such films is therefore of technological interest as well as a goal of basic physics and chemistry research. Recent investigations have demonstrated the usefulness of energetic ion beam deposition in the preparation of such films. We have begun an electron microscopy investigation into the microstructure and electron energy loss spectra of diamond like carbon thin films prepared by energetic ion beam deposition.The carbon films were deposited using the MEIRA ion beam facility at the Soreq Nuclear Research Center in Yavne, Israel. Mass selected C+ beams in the range 50 to 300 eV were directed onto Si {100} which had been etched with HF prior to deposition.

Electron-diffraction studies of amorphous carbon thin films

1993 ◽  
Vol 51 ◽  
pp. 1100-1101
Author(s):  
David A. Muller
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Amorphous Carbon ◽  
Glassy Carbon ◽  
Spherical Structure ◽  
Local Ordering ◽  
Carbon Arc ◽  
Similar Appearance ◽  
Carbon Thin Films ◽  
Large Spherical

The sp2 rich amorphous carbons have a wide variety of microstructures ranging from flat sheetlike structures such as glassy carbon to highly curved materials having similar local ordering to the fullerenes. These differences are most apparent in the region of the graphite (0002) reflection of the energy filtered diffracted intensity obtained from these materials (Fig. 1). All these materials consist mainly of threefold coordinated atoms. This accounts for their similar appearance above 0.8 Å-1. The fullerene curves (b,c) show a string of peaks at distance scales corresponding to the packing of the large spherical and oblate molecules. The beam damaged C60 (c) shows an evolution to the sp2 amorphous carbons as the spherical structure is destroyed although the (220) reflection in fee fcc at 0.2 Å-1 does not disappear completely. This 0.2 Å-1 peak is present in the 1960 data of Kakinoki et. al. who grew films in a carbon arc under conditions similar to those needed to form fullerene rich soots.

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