Highly Conductive Transparent and Flexible Electrodes Including Double-Stacked Thin Metal Films for Transparent Flexible Electronics

2017 ◽  
Vol 9 (19) ◽  
pp. 16343-16350 ◽  
Author(s):  
Jun Hee Han ◽  
Do-hong Kim ◽  
Eun Gyo Jeong ◽  
Tae-Woo Lee ◽  
Myung Keun Lee ◽  
...  
Keyword(s):  
Flexible Electronics ◽  
Metal Films ◽  
Thin Metal ◽  
Thin Metal Films ◽  
Flexible Electrodes

Carbon Nanofiber Reinforced Strain Sensors with High Breathability and Anisotropic Sensitivity

2021 ◽  
Author(s):  
Shuhua Peng ◽  
Shuying Wu ◽  
Yuyan Yu ◽  
Zhao Sha ◽  
Guang Li ◽  
...  
Keyword(s):  
Flexible Electronics ◽  
Carbon Nanofiber ◽  
Wearable Sensors ◽  
Metal Films ◽  
Strain Sensors ◽  
Thin Metal ◽  
Thin Metal Films ◽  
Direct Deposition ◽  
Elastic Substrates

Direct deposition of thin metal films on highly elastic substrates is a major technique to fabricate flexible electronics such as wearable sensors, stretchable transistors, and deformable displays. However, these devices...

Metal Microstructures in Advanced CMOS Devices

1996 ◽  
Vol 54 ◽  
pp. 358-359
Author(s):  
L. M. Gignac ◽  
K. P. Rodbell
Keyword(s):  
Grain Boundaries ◽  
Semiconductor Device ◽  
Chemical Vapor ◽  
Microstructural Characterization ◽  
Metal Films ◽  
Thin Metal ◽  
Electrical Performance ◽  
Thin Metal Films ◽  
Chemical Vapor Deposited ◽  
Boundary Properties

As advanced semiconductor device features shrink, grain boundaries and interfaces become increasingly more important to the properties of thin metal films. With film thicknesses decreasing to the range of 10 nm and the corresponding features also decreasing to sub-micrometer sizes, interface and grain boundary properties become dominant. In this regime the details of the surfaces and grain boundaries dictate the interactions between film layers and the subsequent electrical properties. Therefore it is necessary to accurately characterize these materials on the proper length scale in order to first understand and then to improve the device effectiveness. In this talk we will examine the importance of microstructural characterization of thin metal films used in semiconductor devices and show how microstructure can influence the electrical performance. Specifically, we will review Co and Ti silicides for silicon contact and gate conductor applications, Ti/TiN liner films used for adhesion and diffusion barriers in chemical vapor deposited (CVD) tungsten vertical wiring (vias) and Ti/AlCu/Ti-TiN films used as planar interconnect metal lines.

1/f noise and nonlinear effects in thin metal films

1997 ◽  
Vol 167 (6) ◽  
pp. 623 ◽  
Author(s):  
Gennadii P. Zhigal'skii
Keyword(s):  
Nonlinear Effects ◽  
Metal Films ◽  
Thin Metal ◽  
Thin Metal Films

On the electrocatalytic symbiotic synergism between Pt, Ni and Al in plasma vapour deposited PtxNiyAlz thin metal films for water electrolysis

2021 ◽  
Vol 494 ◽  
pp. 229344
Author(s):  
Roelof J. Kriek ◽  
Liesel A. van Heerden ◽  
Anzel Falch ◽  
Malcolm I. Gillespie ◽  
Alaa Y. Faid ◽  
...  
Keyword(s):  
Water Electrolysis ◽  
Metal Films ◽  
Thin Metal ◽  
Thin Metal Films

van der Waals energy of an atom in the proximity of thin metal films

2000 ◽  
Vol 61 (5) ◽  
Author(s):  
M. Boström ◽  
Bo E. Sernelius
Keyword(s):  
Van Der Waals ◽  
Metal Films ◽  
Thin Metal ◽  
Thin Metal Films
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