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Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry
ACS Applied Materials & Interfaces
◽
10.1021/acsami.8b15091
◽
2019
◽
Vol 11
(4)
◽
pp. 4500-4506
◽
Cited By ~ 2
Author(s):
Mariavitalia Tiddia
◽
Ichiro Mihara
◽
Martin P. Seah
◽
Gustavo Ferraz Trindade
◽
Felix Kollmer
◽
...
Keyword(s):
Mass Spectrometry
◽
Focused Ion Beam
◽
Secondary Ion Mass Spectrometry
◽
Ion Beam
◽
Time Of Flight
◽
Chemical Imaging
◽
Buried Interfaces
◽
Ion Mass Spectrometry
◽
Secondary Ion
Download Full-text
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Journal of the Vacuum Society of Japan
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◽
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◽
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◽
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Rapid Communications in Mass Spectrometry
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◽
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Practical Aspects of Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry Analysis Enhanced by Fluorine Gas Coinjection
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◽
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◽
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◽
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◽
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Three-Dimensional Image of Cleavage Bodies in Nuclei Is Configured Using Gas Cluster Ion Beam with Time-of-Flight Secondary Ion Mass Spectrometry
Scientific Reports
◽
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◽
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◽
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◽
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Chemical Imaging of Fingerprint on RMB Banknotes Using Time-of-Flight Secondary Ion Mass Spectrometry
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◽
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◽
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Analytical Chemistry
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