High-Resolution Epifluorescence and Time-of-Flight Secondary Ion Mass Spectrometry Chemical Imaging Comparisons of Single DNA Microarray Spots

Archana N. Rao; Nicolas Vandencasteele; Lara J. Gamble; David W. Grainger

doi:10.1021/ac3019334

High-Resolution Epifluorescence and Time-of-Flight Secondary Ion Mass Spectrometry Chemical Imaging Comparisons of Single DNA Microarray Spots

Analytical Chemistry ◽

10.1021/ac3019334 ◽

2012 ◽

Vol 84 (24) ◽

pp. 10628-10636 ◽

Cited By ~ 17

Author(s):

Archana N. Rao ◽

Nicolas Vandencasteele ◽

Lara J. Gamble ◽

David W. Grainger

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Dna Microarray ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Cited By ~ 5

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

Surface analysis of pyrite in the No. 9 coal seam, Wuda Coalfield, Inner Mongolia, China, using high-resolution time-of-flight secondary ion mass-spectrometry

International Journal of Coal Geology ◽

10.1016/s0166-5162(03)00109-5 ◽

2003 ◽

Vol 55 (2-4) ◽

pp. 139-150 ◽

Cited By ~ 60

Author(s):

Shifeng Dai ◽

Xiaoqiang Hou ◽

Deyi Ren ◽

Yuegang Tang

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Coal Seam ◽

Surface Analysis ◽

Inner Mongolia ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Secondary Ion

Chemical Imaging of Fingerprint on RMB Banknotes Using Time-of-Flight Secondary Ion Mass Spectrometry

Chinese Journal of Analytical Chemistry ◽

10.1016/s1872-2040(20)60059-7 ◽

2020 ◽

Vol 48 (11) ◽

pp. 1511-1518

Author(s):

Wen-Jie LI ◽

Ling-Hui SUN ◽

Wei YOU ◽

Li-Xue WANG ◽

Ya-Bin ZHAO ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

Inter-diffusion between PMMA and PVDF during lamination studied by time-of-flight secondary ion mass spectrometry chemical imaging

Surface and Interface Analysis ◽

10.1002/sia.1226 ◽

2002 ◽

Vol 33 (5) ◽

pp. 455-458 ◽

Cited By ~ 7

Author(s):

Jiyun Feng ◽

Lin Li ◽

Chi-Ming Chan ◽

Lu-Tao Weng

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

Chemical Imaging of Pharmaceuticals by Time-of-flight Secondary Ion Mass Spectrometry

ChemInform ◽

10.1002/chin.200410300 ◽

2004 ◽

Vol 35 (10) ◽

Author(s):

S. Y. Luk ◽

N. Patel ◽

M. C. Davies

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time Of Flight Secondary Ion Mass spectrometry: Chemical Imaging

Microscopy and Microanalysis ◽

10.1017/s143192761600622x ◽

2016 ◽

Vol 22 (S3) ◽

pp. 1076-1077

Author(s):

Sachin Attavar ◽

David A. Cole ◽

Arwa Ginwalla ◽

Jim Gibson

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

Investigation of the Surface Chemical Structure of Some Biomedical Poly(amidoamine)s Using High-Resolution X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Macromolecules ◽

10.1021/ma00128a041 ◽

1995 ◽

Vol 28 (24) ◽

pp. 8259-8271 ◽

Cited By ~ 10

Author(s):

A. G. Shard ◽

L. Sartore ◽

M. C. Davies ◽

P. Ferruti ◽

A. J. Paul ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Photoelectron Spectroscopy ◽

Chemical Structure ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Surface Chemical ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

Surface and trace analysis by high‐resolution time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576009 ◽

1989 ◽

Vol 7 (3) ◽

pp. 1823-1828 ◽

Cited By ~ 25

Author(s):

E. Niehuis ◽

T. Heller ◽

U. Jürgens ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Trace Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Secondary Ion

Analysis of surface contaminants on gallium arsenide and silicon by high-resolution time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.584777 ◽

1989 ◽

Vol 7 (3) ◽

pp. 512 ◽

Cited By ~ 20

Author(s):

E. Niehuis

Keyword(s):

Mass Spectrometry ◽

Gallium Arsenide ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Surface Contaminants ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.2206191 ◽

2006 ◽

Vol 24 (4) ◽

pp. 1203-1207 ◽

Cited By ~ 8

Author(s):

Tae Geol Lee ◽

Hyun Kyong Shon ◽

Kyung-Bok Lee ◽

Jinmo Kim ◽

Insung S. Choi ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Imaging Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion