Radiation Degradation and Film Solubility Rates of Poly(butene-1-sulfone)

Author(s):  
LARRY STILLWAGON
1990 ◽  
Vol 20 (5-6) ◽  
pp. 359-365 ◽  
Author(s):  
V.M. Botnaryuk ◽  
L.V. Gorchiak ◽  
G.M. Grigorieva ◽  
M.B. Kagan ◽  
T.A. Kozyreva ◽  
...  

2009 ◽  
Vol 67 (7-8) ◽  
pp. 1513-1515 ◽  
Author(s):  
Hee-Sub Lee ◽  
Jong-Il Choi ◽  
Jae-Hun Kim ◽  
Kwang-Won Lee ◽  
Young-Jin Chung ◽  
...  

1995 ◽  
Vol 46 (4-6) ◽  
pp. 797-800
Author(s):  
B. Bartoníček ◽  
V. Hnát ◽  
I. Janovský ◽  
R. Pejša

2021 ◽  
Vol 2103 (1) ◽  
pp. 012068
Author(s):  
D Mitina ◽  
E Verbitskaya ◽  
I Eremin ◽  
N Fadeeva

Abstract The presented paper is focused around radiation damage of silicon material under the different ions irradiation. The ion total energy range is 0.7 GeV for 7Li to 208 GeV for 208Pb. The results of TRIM modeling for the set of six ions are presented. The extracted information about vacancy production allows making first assumptions of the Si degradation dependence on mass and energy of the incident ion.


Sign in / Sign up

Export Citation Format

Share Document