Epitaxial Growth Mechanism for Perovskite Oxide Thin Films under Pulsed Laser Irradiation in Chemical Solution Deposition Process

2008 ◽  
Vol 20 (23) ◽  
pp. 7344-7351 ◽  
Author(s):  
Tomohiko Nakajima ◽  
Tetsuo Tsuchiya ◽  
Masaki Ichihara ◽  
Hideaki Nagai ◽  
Toshiya Kumagai
Keyword(s):  
Thin Films ◽  
Epitaxial Growth ◽  
Growth Mechanism ◽  
Chemical Solution Deposition ◽  
Pulsed Laser ◽  
Deposition Process ◽  
Perovskite Oxide ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Pulsed Laser Irradiation

scholarly journals Effect of excess Pb on epitaxial growth of Pb(Mg1/3Nb2/3)O3 thin films prepared by chemical solution deposition process

2013 ◽  
Vol 121 (1416) ◽  
pp. 638-643 ◽  
Author(s):  
Takanori KIGUCHI ◽  
Tomohito TSUKAMOTO ◽  
Cangyu FAN ◽  
Masahiko NISHIJIMA ◽  
Toyohiko J. KONNO
Keyword(s):  
Thin Films ◽  
Epitaxial Growth ◽  
Chemical Solution Deposition ◽  
Deposition Process ◽  
Chemical Solution ◽  
Solution Deposition

scholarly journals Chemical Solution Deposition of La-Substituted BiFe0.5Sc0.5O3 Perovskite Thin Films on Different Substrates

Coatings ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 307
Author(s):  
Diana Griesiute ◽  
Dovydas Karoblis ◽  
Lina Mikoliunaite ◽  
Aleksej Zarkov ◽  
Andrei N. Salak ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Cost Effective ◽  
Deposition Process ◽  
Stability Study ◽  
Fused Silica ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Optimal Annealing Temperature ◽  
Xrd Patterns

In the present work, polycrystalline Bi0.67La0.33Fe0.5Sc0.5O3 thin films were synthesized using a simple and cost-effective chemical solution deposition process employing the spin coating technique. In order to check the feasibility of the fabrication of thin films on various types of substrates, the films were deposited on Pt-coated silicon, silicon, sapphire, corundum, fused silica and glass. Based on the results of thermogravimetric analysis of precursor and thermal stability study, it was determined that the optimal annealing temperature for the formation of perovskite structure is 600 °C. It was observed that the relative intensity of the pseudocubic peaks (001)p and (011)p in the XRD patterns is influenced by the nature of substrates, suggesting that the formed crystallites have some preferred orientation. Roughness of the films was determined to be dependent on the nature of the substrate.

Epitaxial Growth of Solution-Based Rare-Earth Niobate, RE3NbO7, Films on Biaxially Textured Ni–W Substrates

2005 ◽  
Vol 20 (1) ◽  
pp. 6-9 ◽  
Author(s):  
M. Paranthaman ◽  
M.S. Bhuiyan ◽  
S. Sathyamurthy ◽  
H.Y. Zhai ◽  
A. Goyal ◽  
...  
Keyword(s):  
Rare Earth ◽  
Critical Current Density ◽  
Epitaxial Growth ◽  
Chemical Solution Deposition ◽  
Ybco Film ◽  
Pulsed Laser ◽  
Buffer Layers ◽  
Laser Deposition ◽  
Chemical Solution ◽  
Solution Deposition

A new series of rare earth-niobate, RE3NbO7 (RE=Y,Gd,Eu), buffer layers were developed for the growth of superconducting YBa2Cu3O7−δ (YBCO) films on biaxially textured Ni–W (3 at.%) substrates. Using chemical solution deposition, smooth, crack-free, and epitaxial RE3NbO7 (RE = Y,Gd,Eu) films were grown on cube-textured Ni–W substrate. YBCO film with a critical current density of 1.1 × 106 A/cm2 in self-field at 77 K was grown directly on a single Gd3NbO7-buffered Ni–W substrate using pulsed laser deposition.

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