Detachment Limited Kinetics of Gold Diffusion through Ultrathin Oxide Layers

2014 ◽  
Vol 118 (31) ◽  
pp. 17549-17555 ◽  
Author(s):  
Jan Čechal ◽  
Josef Polčák ◽  
Tomáš Šikola
1999 ◽  
Vol 567 ◽  
Author(s):  
H.-J. Müssig ◽  
J. Dabrowski ◽  
S. Hinrich

ABSTRACTWe report the first direct observation of dissociative chemisorption of oxygen molecules on a silicon surface at room temperature via a molecular precursor state. We link this to the fact that smooth oxide layers can be grown easily on Si(113). The process of initial oxidation is discussed in terms of surface diffusion paths and surface stress. First ab initiocalculations help elucidate the favored adsorption sites and the oxidation mechanism. Experimental evidence was found for bond geometries resulting in the quasi-epitaxial growth of a chemisorption layer on the substrate at elevated temperatures (600°C). In contrast to the first stages of Si(001) oxidation, neither defects nor the ejection of Si atoms plays a significant role during the initial oxidation of Si(113).


2018 ◽  
Vol 47 (9) ◽  
pp. 5105-5108 ◽  
Author(s):  
K. P. Konin ◽  
Yu. V. Goltvyansky ◽  
L. A. Karachevtseva ◽  
M. I. Karas ◽  
D. V. Morozovs’ka
Keyword(s):  

2009 ◽  
Vol 256 (2) ◽  
pp. 365-370 ◽  
Author(s):  
H. Winter ◽  
J. Seifert ◽  
D. Blauth ◽  
M. Busch ◽  
A. Schüller ◽  
...  

2007 ◽  
Vol 567-568 ◽  
pp. 237-240
Author(s):  
Galina Gosmanová ◽  
Ivo Kraus ◽  
Michal Kolega ◽  
Věra Vrtílková

The results of X-ray diffraction analysis of macroscopic stresses σ and crystallite size D in oxide layers are presented in this contribution. The oxide layers were formed on tubular specimens of Zircaloy 4 and Zr1Nb alloys which were simultaneously oxidized for various times under temperature transient conditions (oxidation in water at 360 °C with a short-time shock in steam at 500 °C). A qualitative relation was outlined between the residual stresses in oxide layers and corrosion kinetics of the alloys under investigation.


1998 ◽  
Vol 398 (1-2) ◽  
pp. 134-142 ◽  
Author(s):  
Ken Fujita ◽  
Heiji Watanabe ◽  
Masakazu Ichikawa

2008 ◽  
Vol 44 (5) ◽  
pp. 530-542 ◽  
Author(s):  
A. V. Churikov ◽  
A. V. Ivanishchev ◽  
I. A. Ivanishcheva ◽  
K. V. Zapsis ◽  
I. M. Gamayunova ◽  
...  

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