scholarly journals Scanning Near-Field and Confocal Raman Microscopic Investigation of P3HT−PCBM Systems for Solar Cell Applications

2006 ◽  
Vol 39 (13) ◽  
pp. 4493-4496 ◽  
Author(s):  
E. Klimov ◽  
W. Li ◽  
X. Yang ◽  
G. G. Hoffmann ◽  
J. Loos
Keyword(s):  
Solar Cell ◽  
Near Field ◽  
Microscopic Investigation ◽  
Confocal Raman

Sub-micron Optoelectronic Properties of Polycrystalline Solar Cell Materials

2005 ◽  
Vol 865 ◽  
Author(s):  
S. Smith ◽  
R. Dhere ◽  
T. Gessert ◽  
P. Stradins ◽  
T. Wang ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Grain Boundaries ◽  
Surface Passivation ◽  
Near Field ◽  
Spectroscopic Properties ◽  
Optoelectronic Properties ◽  
Cdte Solar Cells ◽  
Cell Structures ◽  
Photo Response

AbstractGeneration, transport and collection of carriers in polycrystalline (PX) solar cells and their constituent materials are poorly understood, and significantly different than in their single-crystal counterparts. Recent theoretical and experimental results have put forth the expectation that grain boundaries in PX-solar cell materials such as CdTe and CuInGaSe2, either as-grown or after appropriate post-growth treatment, may have electronic properties which are advantageous to charge separation and solar cell operation[1-3]. However, a microscopic picture of the spatial variations in the optoelectronic properties of these materials is, for the most part, still lacking. The goal of the work reported here is to explore the optoelectronic and spectroscopic properties of grain-boundaries in these materials at the nanometer length-scale, via novel, high-resolution optical techniques. Towards this end, a significant enhancement in photo-response near grain boundaries in CdTe solar cells, consistent with models put forth in reference 2, was observed via near-field Optical Beam Induced Current (n-OBIC) [4]. A systematic μ-PL study of the effect of CdC12-treatment on recombination in CdTe/CdS solar cell structures of varying thickness directly examined the variation in optoelectronic properties at grain-boundaries in this material, revealing the grain-boundary and surface passivation effects of this important post-growth processing step. For comparison, we also studied the effects of SiNx post-growth treatment and annealing on the photo-response of PX-silicon solar cells using n-OBIC. These results and our most-recent n-OBIC measurements in CdTe and CuInGaSe2 solar cells are discussed.

Investigation of defects in crystalline silicon solar cells by confocal Raman spectroscopy

2018 ◽  
Vol 29 (8) ◽  
pp. 1525-1533 ◽  
Author(s):  
Gilbert O Osayemwenre ◽  
Edson L Meyer ◽  
Raymond Taziwa
Keyword(s):  
Raman Spectroscopy ◽  
Solar Cells ◽  
Solar Cell ◽  
Stress Level ◽  
Crystalline Silicon ◽  
Raman Band ◽  
Reverse Direction ◽  
Confocal Raman Spectroscopy ◽  
Confocal Raman ◽  
Solar Material

Defects in solar cells can be caused during processing or through a benign event like a falling leaf when operating in an outdoor system. Shading caused by such a leaf can result in the cell operating in the reverse direction and ultimately in hotspot formation, which in turn can cause the entire cell to breakdown and essentially become a power dissipator rather than a producer. More often than not, this reverse biasing of the cell will enhance the effect of any inherent defect. In this study, poly-Si cells were reverse biased to enhance the effect of their inherent defect. These defects were then analysed using non-destructive confocal Raman spectroscopy, since this technique allows us to observe small defects in cells/material using the intensity of the transverse optic bands. The intensity of defect-induced Raman band has a direct relationship with the observed morphological defects of the reverse biased cell. The quality of the active layer was also investigated; this includes the chemical composition and the stress level which can be found through the single spectrum bandwidth. The efficiency of solar material depends on the absorption capability of the solar material, while the optical and the electrical properties to a large extent determine the absorption capability of solar cell. However, its structure, defect and stress level can offset the total optical and electronic properties. The present study reveals defect in micro-level and the stress induced in the affected region of the solar cell. Confocal Raman is suitable for characterising stresses in relation to microstructure, defect level as well as the manufacturer-induced defect in the substrate.

Microscopic investigation of near-field spray characteristics of 2-methylfuran, ethanol and isooctane under flash boiling conditions

Fuel ◽  
2018 ◽  
Vol 215 ◽  
pp. 142-152 ◽  
Author(s):  
Bo Wang ◽  
Ziman Wang ◽  
Xiuchao Bao ◽  
Yanfei Li ◽  
Yizhou Jiang ◽  
...  
Keyword(s):  
Near Field ◽  
Microscopic Investigation ◽  
Spray Characteristics ◽  
Flash Boiling

Experimental Limits of Light Capture in Thin Film Silicon Devices

2008 ◽  
Vol 1101 ◽  
Author(s):  
Ales Poruba ◽  
Petr Klapetek ◽  
Jakub Holovsky ◽  
Adam Purkrt ◽  
Milan Vanecek
Keyword(s):  
Thin Film ◽  
Angular Distribution ◽  
Solar Cell ◽  
Silicon Solar Cell ◽  
Light Trapping ◽  
Scattered Light ◽  
Near Field ◽  
Input Parameter ◽  
Distribution Functions ◽  
Thin Film Silicon

AbstractNew approach for the determination of the angular distribution of the scattered light at nano-rough surfaces/interfaces from AFM (Atomic Force Microscopy) data is presented. Calculation comes from modeling the electromagnetic field in the tight vicinity of the nano-rough surface by complex solution of Maxwell's equations and subsequent near field to far field transform. This method is demonstrated for four types of transparent conductive oxides (with rough free surfaces) deposited on glass substrates. As a result we have the amount and angular distribution of the scattered light „observed” in both transmission and reflection. Moreover calculation can be done for real sample dimensions (to compare the results with the measurement of the angular distribution function using LED laser) or for a semi-infinite sample which suppresses the interference effects and thus such distribution functions can be used as an input parameter for our 3-dimensional optical model CELL for thin film silicon solar cell modeling.In the second part of this contribution we describe our experiment of thin film silicon solar cell characterization by Light Beam Induced Current (LBIC). This measurement done for laboratory solar cell structures reveals the light scattering and light trapping properties of the multilayer stack on a glass substrate. We suggest the test structure for the direct back reflector quality comparison and thus also for its optimization.

Three-dimensional scanning near field optical microscopy (3D-SNOM) imaging of random arrays of copper nanoparticles: implications for plasmonic solar cell enhancement

Nanoscale ◽  
2015 ◽  
Vol 7 (1) ◽  
pp. 252-260 ◽  
Author(s):  
Sabastine Ezugwu ◽  
Hanyang Ye ◽  
Giovanni Fanchini
Keyword(s):  
Solar Cell ◽  
Copper Nanoparticles ◽  
Organic Solar Cells ◽  
Imaging Technique ◽  
Near Field ◽  
Three Dimensional ◽  
Photoconversion Efficiency ◽  
Cu Nanoparticles ◽  
Threefold Increase ◽  
Random Arrays

A 3D-SNOM imaging technique is used to design plasmonically enhanced organic solar cells with a threefold increase in photoconversion efficiency by the application of a 200 nm SiO2 spacer between an array of Cu nanoparticles and the active layer.

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