Probing the Chain and Crystal Lattice Orientation in Polyethylene Thin Films by Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy

2010 ◽  
Vol 43 (19) ◽  
pp. 8153-8161 ◽  
Author(s):  
Yantian Wang ◽  
Ying Zou ◽  
Tohru Araki ◽  
Jan Lüning ◽  
A. L. D. Kilcoyne ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Crystal Lattice ◽  
Lattice Orientation ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Influence of Al on the local structure of Nd-doped TiO2 thin films: A combined luminescence and X-ray absorption fine structure analysis

2019 ◽  
Vol 246 ◽  
pp. 49-52 ◽  
Author(s):  
Mariko Murayama ◽  
Kensaku Yoda ◽  
Shuji Komuro ◽  
Hiroaki Nitani ◽  
Iain F. Crowe ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Structure Analysis ◽  
Local Structure ◽  
Tio2 Thin Films ◽  
Doped Tio2 ◽  
X Ray ◽  
Absorption Fine ◽  
Fine Structure Analysis ◽  
X Ray Absorption

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Study by Extended X-ray Absorption Fine Structure Technique and Microscopy of the Amorphous State of Titanium Diboride Thin Films

1988 ◽  
Vol 71 (11) ◽  
pp. 948-955 ◽  
Author(s):  
ALAIN E. KALOYEROS ◽  
WENDELL S. WILLIAMS ◽  
RICHARD B. RIZK ◽  
FREDERICK C. BROWN ◽  
ALEX E. GREENE
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Titanium Diboride ◽  
Amorphous State ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Near edge X-ray absorption fine structure study of Zn[sub 0.8]Mg[sub 0.2]O thin films

2013 ◽  
Author(s):  
Ankush Vij ◽  
Amanpal Singh ◽  
Ravi Kumar ◽  
Sanjeev Gautam ◽  
Dinesh Kumar ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Structure Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements

2018 ◽  
Vol 10 (9) ◽  
pp. 1372-1376 ◽  
Author(s):  
Jitendra Pal Singh ◽  
Weon Cheol Lim ◽  
Ik-Jae Lee ◽  
Sung OK Won ◽  
Keun Hwa Chae
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Surface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Investigating the structure of boron nitride nanotubes by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy

2005 ◽  
Vol 7 (6) ◽  
pp. 1103 ◽  
Author(s):  
Tirandai Hemraj-Benny ◽  
Sarbajit BanerjeeCurrent address: Department ◽  
Sharadha Sambasivan ◽  
Daniel A. Fischer ◽  
Weiqiang Han ◽  
...  
Keyword(s):  
Fine Structure ◽  
Boron Nitride ◽  
Boron Nitride Nanotubes ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption
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