scholarly journals Active Liquid Crystal Tuning of Metallic Nanoantenna Enhanced Light Emission from Colloidal Quantum Dots

Nano Letters ◽  
2014 ◽  
Vol 14 (10) ◽  
pp. 5555-5560 ◽  
Author(s):  
Aimi Abass ◽  
Said Rahimzadeh-Kalaleh Rodriguez ◽  
Thomas Ako ◽  
Tangi Aubert ◽  
Marc Verschuuren ◽  
...  

2007 ◽  
Vol 90 (2) ◽  
pp. 023110 ◽  
Author(s):  
Hao Huang ◽  
August Dorn ◽  
Vladimir Bulovic ◽  
Moungi G. Bawendi


2017 ◽  
Vol 4 (2) ◽  
pp. 170-183 ◽  
Author(s):  
Yuequn Shang ◽  
Zhijun Ning

Abstract The application of colloidal quantum dots for light-emitting devices has attracted considerable attention in recent years, due to their unique optical properties such as size-dependent emission wavelength, sharp emission peak and high luminescent quantum yield. Tremendous efforts have been made to explore quantum dots for light-emission applications such as light-emitting diodes (LEDs) and light converters. The performance of quantum-dots-based light-emitting diodes (QD-LEDs) has been increasing rapidly in recent decades as the development of quantum-dots synthesis, surface-ligand engineering and device-architecture optimization. Recently, the external quantum efficiencies of red quantum-dots LEDs have exceeded 20.5% with good stability and narrow emission peak. In this review, we summarize the recent advances in QD-LEDs, focusing on quantum-dot surface engineering and device-architecture optimization.





Author(s):  
N. Kuji ◽  
T. Takeda ◽  
S. Nakamura ◽  
Y. Komine

Abstract A new logic-model derivation method for leak faults observed by light-emission microscopy (LEM) or in liquid-crystal analysis (LCA) has been developed to verify those faults by comparing them with failures observed on an LSI tester. Since CMOS devices display various kinds of faulty behavior depending on leak resistance, it is essential to include the effects of this resistance in logic models. Considering that the resistance of leaks observed in LEM and LCA ranges from 10 to 10,000 ohm, the new logic models have been derived so that the leak fault could be easily incorporated into logic simulators without SPICE simulation. The feasibility of the proposed method has been demonstrated by using it to diagnose LEM and LCA faults causing logic failure in a 20k-gate logic LSI circuit.





AIP Advances ◽  
2016 ◽  
Vol 6 (7) ◽  
pp. 075117 ◽  
Author(s):  
Elad Hechster ◽  
Arthur Shapiro ◽  
Efrat Lifshitz ◽  
Gabby Sarusi


Author(s):  
Lishuang Wang ◽  
Ying Lv ◽  
Jie Lin ◽  
Jialong Zhao ◽  
Xingyuan Liu ◽  
...  

For quantum dots light-emitting diodes (QLEDs), typical colloidal quantum dots (QDs) are usually composed of a core/shell heterostructure which is covered with organic ligands as surface passivated materials to confine...



2021 ◽  
Vol 103 (5) ◽  
Author(s):  
Sourav Patranabish ◽  
Yiwei Wang ◽  
Aloka Sinha ◽  
Apala Majumdar


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