scholarly journals High‐Angular Resolution Electron Backscatter Diffraction as a New Tool for Mapping Lattice Distortion in Geological Minerals

2019 ◽  
Vol 124 (7) ◽  
pp. 6337-6358 ◽  
Author(s):  
D. Wallis ◽  
L. N. Hansen ◽  
T. B. Britton ◽  
A. J. Wilkinson
Keyword(s):  
Lattice Distortion ◽  
Angular Resolution ◽  
Electron Backscatter Diffraction ◽  
High Angular Resolution ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

scholarly journals Selectively Electron-Transparent Microstamping Toward Concurrent Digital Image Correlation and High-Angular Resolution Electron Backscatter Diffraction (EBSD) Analysis

2017 ◽  
Vol 23 (6) ◽  
pp. 1091-1095 ◽  
Author(s):  
Timothy J. Ruggles ◽  
Geoffrey F. Bomarito ◽  
Andrew H. Cannon ◽  
Jacob D. Hochhalter
Keyword(s):  
Digital Image Correlation ◽  
Digital Image ◽  
Angular Resolution ◽  
Electron Backscatter Diffraction ◽  
Image Correlation ◽  
Ebsd Analysis ◽  
High Angular Resolution ◽  
Resolution Electron ◽  
Electron Backscatter ◽  
Backscatter Diffraction

AbstractDigital image correlation (DIC) in a scanning electron microscope and high-angular resolution electron backscatter diffraction (HREBSD) provide valuable and complementary data concerning local deformation at the microscale. However, standard surface preparation techniques are mutually exclusive, which makes combining these techniques in situ impossible. This paper introduces a new method of applying surface patterning for DIC, namely a urethane microstamp, that provides a pattern with enough contrast for DIC at low accelerating voltages, but is virtually transparent at the higher voltages necessary for HREBSD and conventional EBSD analysis. Furthermore, microstamping is inexpensive and repeatable, and is more suitable to the analysis of patterns from complex surface geometries and larger surface areas than other patterning techniques.

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