Experimental verification of the isotropic onset of percolation in 3D crack networks in polycrystalline materials with implications for the applicability of percolation theory to crustal rocks

2021 ◽  
Author(s):  
Carl E. Renshaw ◽  
Andrii Murdza ◽  
Erland M. Schulson
Keyword(s):  
Experimental Verification ◽  
Percolation Theory ◽  
Polycrystalline Materials ◽  
Crustal Rocks

scholarly journals Analysis of Microstructure Images Referred to Percolation Theory

2015 ◽  
Vol 15 (1) ◽  
pp. 109-112 ◽  
Author(s):  
W. Trzaskowski ◽  
W. Sobaszek ◽  
D. Myszka ◽  
S. Świłło
Keyword(s):  
Percolation Theory ◽  
Spatial Arrangement ◽  
Polycrystalline Materials ◽  
Practical Implementation ◽  
Material Structure ◽  
Two Phase ◽  
Modern Computer ◽  
Planar Images ◽  
Metallographic Image Analysis

Abstract The paper discusses possible applications of the percolation theory in analysis of the microstructure images of polycrystalline materials. Until now, practical use of this theory in metallographic studies has been an almost unprecedented practice. Observation of structures so intricate with the help of this tool is far from the current field of its application. Due to the complexity of the problem itself, modern computer programmes related with the image processing and analysis have been used. To enable practical implementation of the task previously established, an original software has been created. Based on cluster analysis, it is used for the determination of percolation phenomena in the examined materials. For comparative testing, two two-phase materials composed of phases of the same type (ADI matrix and duplex stainless steel) were chosen. Both materials have an austenitic - ferritic structure. The result of metallographic image analysis using a proprietary PERKOLACJA.EXE computer programme was the determination of the content of individual phases within the examined area and of the number of clusters formed by these phases. The outcome of the study is statistical information, which explains and helps in better understanding of the planar images and real spatial arrangement of the examined material structure. The results obtained are expected to assist future determination of the effect that the internal structure of two-phase materials may have on a relationship between the spatial structure and mechanical properties.

Focal construct geometry – a novel approach to the acquisition of diffraction data

2010 ◽  
Vol 43 (2) ◽  
pp. 264-268 ◽  
Author(s):  
Keith Rogers ◽  
Paul Evans ◽  
Joseph Rogers ◽  
JerWang Chan ◽  
Anthony Dicken
Keyword(s):  
Diffraction Data ◽  
Experimental Verification ◽  
Single Point ◽  
Polycrystalline Materials ◽  
Pencil Beam ◽  
X Rays ◽  
Debye Ring ◽  
Novel Approach ◽  
Reflection Geometry ◽  
Point Detector

This paper presents the first use of a simple novel geometry that enables the measurement of diffractograms from polycrystalline materials through linear translation of a point detector. The geometry is such that intensities from all points around any Debye ring are summed to a single point, and thus coherently scattered X-rays are harvested efficiently. Data from initial experimental verification of the approach used in transmission mode are presented and the diffractograms compared with their equivalent measured using a pencil beam. Brief discussions of potential modifications in reflection geometry and applications for fibre samples are also provided.

scholarly journals New Possibilities for Investigation of the Technological Texture Based on Measurement of Electric Parameters: Theoretical Analysis and Experimental Verification

2013 ◽  
Vol 64 (6) ◽  
pp. 376-380 ◽  
Author(s):  
Tomáš Kozík ◽  
Stanislav Minárik
Keyword(s):  
Electrical Properties ◽  
Theoretical Analysis ◽  
Theoretical Result ◽  
Ceramic Material ◽  
Experimental Verification ◽  
Orientation Distribution ◽  
Polycrystalline Materials ◽  
Mathematical Framework ◽  
Electric Parameters

Abstract Texture is preferred orientation of crystallites in some polycrystalline materials. Different methods are applied to characterize the orientation patterns and determine the orientation distribution. Most of these methods rely on diffraction. This paper introduces the principle of a method used for characterization of ceramics texture based on anisotropy of electrical properties of crystallites in ceramics. The mathematical framework of this method is presented in theoretical part of our work. In experimental section we demonstrate how the theoretical result could be used to evaluate technology texture of ceramic material intended for the production of electronic insulators.

Observation of secondary slip systems in tungsten bicrystals

1984 ◽  
Vol 42 ◽  
pp. 478-479
Author(s):  
J. R. Fekete ◽  
R. Gibala
Keyword(s):  
Stress Field ◽  
Grain Boundaries ◽  
Deformation Behavior ◽  
Stress Axis ◽  
Polycrystalline Materials ◽  
Slip Systems ◽  
Metallic Materials ◽  
Twist Boundary ◽  
Secondary Slip ◽  
Plane Normal

The deformation behavior of metallic materials is modified by the presence of grain boundaries. When polycrystalline materials are deformed, additional stresses over and above those externally imposed on the material are induced. These stresses result from the constraint of the grain boundaries on the deformation of incompatible grains. This incompatibility can be elastic or plastic in nature. One of the mechanisms by which these stresses can be relieved is the activation of secondary slip systems. Secondary slip systems have been shown to relieve elastic and plastic compatibility stresses. The deformation of tungsten bicrystals is interesting, due to the elastic isotropy of the material, which implies that the entire compatibility stress field will exist due to plastic incompatibility. The work described here shows TEM observations of the activation of secondary slip in tungsten bicrystals with a [110] twist boundary oriented with the plane normal parallel to the stress axis.

The structure of amorphous and polycrystalline materials using energy-filtered RDF analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1190-1191
Author(s):  
David Cockayne ◽  
David McKenzie
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Density Function ◽  
Electron Diffraction Pattern ◽  
Polycrystalline Materials ◽  
Nearest Neighbour ◽  
X Ray ◽  
Selected Area Electron Diffraction ◽  
Reduced Density ◽  
System F

The technique of Electron Reduced Density Function (RDF) analysis has ben developed into a rapid analytical tool for the analysis of small volumes of amorphous or polycrystalline materials. The energy filtered electron diffraction pattern is collected to high scattering angles (currendy to s = 2 sinθ/λ = 6.5 Å-1) by scanning the selected area electron diffraction pattern across the entrance aperture to a GATAN parallel energy loss spectrometer. The diffraction pattern is then converted to a reduced density function, G(r), using mathematical procedures equivalent to those used in X-ray and neutron diffraction studies.Nearest neighbour distances accurate to 0.01 Å are obtained routinely, and bond distortions of molecules can be determined from the ratio of first to second nearest neighbour distances. The accuracy of coordination number determinations from polycrystalline monatomic materials (eg Pt) is high (5%). In amorphous systems (eg carbon, silicon) it is reasonable (10%), but in multi-element systems there are a number of problems to be overcome; to reduce the diffraction pattern to G(r), the approximation must be made that for all elements i,j in the system, fj(s) = Kji fi,(s) where Kji is independent of s.

Morphology and atomic structure of segregated grain boundaries in Cu-Sb

1992 ◽  
Vol 50 (1) ◽  
pp. 254-255
Author(s):  
R. W. Fonda ◽  
D. E. Luzzi
Keyword(s):  
Grain Boundary ◽  
Grain Boundaries ◽  
Intergranular Fracture ◽  
Atomic Structure ◽  
Copper Alloys ◽  
Polycrystalline Materials ◽  
Grain Boundary Embrittlement ◽  
Boundary Embrittlement

The properties of polycrystalline materials are strongly dependant upon the strength of internal boundaries. Segregation of solute to the grain boundaries can adversely affect this strength. In copper alloys, segregation of either bismuth or antimony to the grain boundary will embrittle the alloy by facilitating intergranular fracture. Very small quantities of bismuth in copper have long been known to cause severe grain boundary embrittlement of the alloy. The effect of antimony is much less pronounced and is observed primarily at lower temperatures. Even though moderate amounts of antimony are fully soluble in copper, concentrations down to 0.14% can cause grain boundary embrittlement.

Interface structures in polycrystalline ceramic materials

1986 ◽  
Vol 44 ◽  
pp. 468-471
Author(s):  
K. J. Morrissey
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Physical And Mechanical Properties ◽  
High Resolution Electron Microscopy ◽  
Ceramic Materials ◽  
Polycrystalline Materials ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Interface Structures

Grain boundaries and interfaces play an important role in determining both physical and mechanical properties of polycrystalline materials. To understand how the structure of interfaces can be controlled to optimize properties, it is necessary to understand and be able to predict their crystal chemistry. Transmission electron microscopy (TEM), analytical electron microscopy (AEM,), and high resolution electron microscopy (HREM) are essential tools for the characterization of the different types of interfaces which exist in ceramic systems. The purpose of this paper is to illustrate some specific areas in which understanding interface structure is important. Interfaces in sintered bodies, materials produced through phase transformation and electronic packaging are discussed.

Electron diffraction studies of amorphous and polycrystalline thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 118-119
Author(s):  
D J H Cockayne ◽  
D R McKenzie
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Polycrystalline Materials ◽  
Good Resolution ◽  
Scattered Intensity ◽  
Radial Density ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Nitrogen Ion ◽  
Diffraction Patterns

The study of amorphous and polycrystalline materials by obtaining radial density functions G(r) from X-ray or neutron diffraction patterns is a well-developed technique. We have developed a method for carrying out the same technique using electron diffraction in a standard TEM. It has the advantage that studies can be made of thin films, and on regions of specimen too small for X-ray and neutron studies. As well, it can be used to obtain nearest neighbour distances and coordination numbers from the same region of specimen from which HREM, EDS and EELS data is obtained.The reduction of the scattered intensity I(s) (s = 2sinθ/λ ) to the radial density function, G(r), assumes single and elastic scattering. For good resolution in r, data must be collected to high s. Previous work in this field includes pioneering experiments by Grigson and by Graczyk and Moss. In our work, the electron diffraction pattern from an amorphous or polycrystalline thin film is scanned across the entrance aperture to a PEELS fitted to a conventional TEM, using a ramp applied to the post specimen scan coils. The elastically scattered intensity I(s) is obtained by selecting the elastically scattered electrons with the PEELS, and collecting directly into the MCA. Figure 1 shows examples of I(s) collected from two thin ZrN films, one polycrystalline and one amorphous, prepared by evaporation while under nitrogen ion bombardment.

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