Fundamental mechanism of performance decrement under evaluative pressure: The influence of awareness of failure

2011 ◽  
Author(s):  
Saya Yamanaka ◽  
Toshikazu Yoshida
1998 ◽  
Author(s):  
Charles E. Lance ◽  
Anthony G. Parisi ◽  
Winston Bennett ◽  
Teachout Jr. ◽  
Harville Mark ◽  
...  

Cancers ◽  
2021 ◽  
Vol 13 (14) ◽  
pp. 3576
Author(s):  
José I. López ◽  
Ildefonso M. De la Fuente

Motility is an inherent characteristic of living cells manifesting cell migration, a fundamental mechanism of survival and development [...]


2014 ◽  
Vol 625 ◽  
pp. 192-195
Author(s):  
Lillia Haddour ◽  
Mourad Keddam ◽  
Nadir Mesrati

Some low purity alumina ceramics with an alumina content ranging from 86% to 93% were investigated, in order to explore the effects of microstructural parameters (grain size, intergranular phase) on mechanical (wear) and dielectrical parameters. The microstructure and worn surfaces were analysed using scaning electron microscopy. The correlation between microstructural, dielectrical properties and wear is discussed. It has been proposed that mechanical and electrical properties are two aspects of the same fundamental mechanism. Key words: Al2O3, Microstructure final, Wear resistance, Breakdown.


2015 ◽  
Vol 738-739 ◽  
pp. 1105-1110 ◽  
Author(s):  
Yuan Qing Qin ◽  
Ying Jie Cheng ◽  
Chun Jie Zhou

This paper mainly surveys the state-of-the-art on real-time communicaton in industrial wireless local networks(WLANs), and also identifys the suitable approaches to deal with the real-time requirements in future. Firstly, this paper summarizes the features of industrial WLANs and the challenges it encounters. Then according to the real-time problems of industrial WLAN, the fundamental mechanism of each recent representative resolution is analyzed in detail. Meanwhile, the characteristics and performance of these resolutions are adequately compared. Finally, this paper concludes the current of the research and discusses the future development of industrial WLANs.


1959 ◽  
Vol 57 (1) ◽  
pp. 49-56 ◽  
Author(s):  
William E. Kappauf ◽  
William E. Powe

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