scholarly journals A general method for analyzing arbitrary planar negative-refractive-index multilayer slab optical waveguide structures

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Yaw-Dong Wu

Abstract In this paper, a general method for analyzing arbitrary planar negative-refractive-index (NRI) multilayer slab optical waveguide structures was proposed. Some degenerated examples were introduced to prove the accuracy of the proposed method. The analytical and numerical results show excellent agreement. The method can also be degenerated to analyze arbitrary planar conventional optical waveguide structures. Based on this general method, the analysis and calculation of any kinds of planar NRI slab optical waveguide structures and planar conventional optical waveguide structures can be achieved easily.

2005 ◽  
Vol 45 (4) ◽  
pp. 294-295 ◽  
Author(s):  
Aaron D. Scher ◽  
Christopher T. Rodenbeck ◽  
Kai Chang

2013 ◽  
Vol 30 (4) ◽  
pp. 1077 ◽  
Author(s):  
Alexander O. Korotkevich ◽  
Kathryn E. Rasmussen ◽  
Gregor Kovačič ◽  
Victor Roytburd ◽  
Andrei I. Maimistov ◽  
...  

2007 ◽  
Vol 21 (30) ◽  
pp. 5075-5089 ◽  
Author(s):  
HALA M. KHALIL ◽  
MOHAMMED M. SHABAT ◽  
SOFYAN A. TAYA ◽  
MAZEN M. ABADLA

In this work, we present an extensive theoretical analysis of nonlinear optical waveguide sensor. The waveguide under consideration consists of a thin dielectrica film surrounded by a self-focused nonlinear cladding and a linear substrate. The nonlinearity of the cladding is considered to be of Kerr-type. Both cases, when the effective refractive index is greater and when it is smaller than the index of the guiding layer, are discussed. The sensitivity of the effective refractive index to any change in the cladding index in evanescent optical waveguide sensor is derived for TM modes. Closed form analytical expressions and normalized charts are given to provide the conditions required for the sensor to exhibit its maximum sensitivity. The results are compared with those of the well-known linear evanescent waveguide sensors.


2016 ◽  
Vol 30 (07) ◽  
pp. 1650088
Author(s):  
Valeriy M. Ishchuk ◽  
Vladimir Sobolev

In this paper, a possibility of use of the controlled decomposition of solid solutions of oxides with perovskite structure in the state of coexisting domains of the antiferroelectric (AFE) and ferroelectric (FE) phases for manufacturing materials with the negative refractive index is demonstrated. The lead zirconate titanate-based solid solutions are considered as an example of substances suitable for creation of such materials. Manufactured composites constitute a dielectric AFE matrix with a structure of conducting interphase boundaries separating domains of the FE and AFE phases. The electric conductivity of the interphase boundaries occurs as a result of the local decomposition of the solid solutions in the vicinity of these boundaries. The decomposition process and consequently the conductivity of the interphase boundaries can be controlled by means of external influences.


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