Local decomposition of solid solutions, nanostructures and optical materials with negative refractive index

2016 ◽  
Vol 30 (07) ◽  
pp. 1650088
Author(s):  
Valeriy M. Ishchuk ◽  
Vladimir Sobolev
Keyword(s):  
Refractive Index ◽  
Electric Conductivity ◽  
Solid Solutions ◽  
Lead Zirconate Titanate ◽  
Perovskite Structure ◽  
Optical Materials ◽  
Negative Refractive Index ◽  
Lead Zirconate ◽  
The State ◽  
Interphase Boundaries

In this paper, a possibility of use of the controlled decomposition of solid solutions of oxides with perovskite structure in the state of coexisting domains of the antiferroelectric (AFE) and ferroelectric (FE) phases for manufacturing materials with the negative refractive index is demonstrated. The lead zirconate titanate-based solid solutions are considered as an example of substances suitable for creation of such materials. Manufactured composites constitute a dielectric AFE matrix with a structure of conducting interphase boundaries separating domains of the FE and AFE phases. The electric conductivity of the interphase boundaries occurs as a result of the local decomposition of the solid solutions in the vicinity of these boundaries. The decomposition process and consequently the conductivity of the interphase boundaries can be controlled by means of external influences.

A Simulation Study of Plasmonic Substrate for In-Process Measurement of Refractive Index in Nano-Stereolithography

2017 ◽  
Vol 11 (5) ◽  
pp. 772-780 ◽  
Author(s):  
Masaki Michihata ◽  
Deqing Kong ◽  
Kiyoshi Takamasu ◽  
Satoru Takahashi ◽  
◽  
...  
Keyword(s):  
Refractive Index ◽  
Lead Zirconate Titanate ◽  
Value Added ◽  
Lead Zirconate ◽  
Process Measurement ◽  
Sensing Range ◽  
Highly Sensitive ◽  
Surface Nanostructures ◽  
Evanescent Light ◽  
Manufacturing Accuracy

Functional surfaces are in demand for recent value-added products. Stereolithography based on evanescent light has been proposed as a technique to fabricate surface nanostructures, but some fabrication error sources must be addressed. In-process measurement is an essential solution to improve the fabrication performance. For in-process measurement in stereolithography, the refractive index of resin is an inherent parameter for product and condition monitoring. This study proposes the in-process measurement of the refractive index of resin based on surface plasmon resonance (SPR). The optical phase response at SPR is highly sensitive to changes in the refractive index of resin but has a narrow sensing range. Therefore, we propose a substrate with a tunable sensing range using lanthanum-modified lead zirconate titanate (PLZT). The structural design was considered using numerical simulation. The SPR conditions were calculated with regard to thickness combinations of PLZT and metal (Ag) films. Depending on these combinations, a sensing range can be tuned on the order of 10-3to 10-4RIU with a sensitivity of 106rad/RIU. However, to realize these performances, the manufacturing accuracy of Ag thin films must be better than 0.1 nm.

Enthalpies of Formation of Lead Zirconate Titanate (PZT) Solid Solutions

2001 ◽  
Vol 161 (2) ◽  
pp. 402-409 ◽  
Author(s):  
Manisha V. Rane ◽  
Alexandra Navrotsky ◽  
George A. Rossetti
Keyword(s):  
Solid Solutions ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Enthalpies Of Formation ◽  
Zirconate Titanate

Phase transitions in polarized samples of multicomponent solid solutions based on lead zirconate titanate

2009 ◽  
Vol 51 (7) ◽  
pp. 1452-1454 ◽  
Author(s):  
I. V. Yukhnov ◽  
V. G. Gavrilyachenko ◽  
A. F. Semenchev ◽  
G. M. Akbaeva
Keyword(s):  
Phase Transitions ◽  
Solid Solutions ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Zirconate Titanate

ChemInform Abstract: Correlation Between the Curie Temperature and the Crystallochemical Parameters of Multicomponent Solid Solutions Based on Lead Zirconate- Titanate.

ChemInform ◽  
2010 ◽  
Vol 27 (50) ◽  
pp. no-no
Author(s):  
N. V. DERGUNOVA ◽  
L. A. REZNICHENKO ◽  
A. YA. DANTSIGER ◽  
O. N. RAZUMOVSKAYA ◽  
S. I. DUDKINA ◽  
...  
Keyword(s):  
Curie Temperature ◽  
Solid Solutions ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Zirconate Titanate

The alternative route of low-temperature preparation of highly oriented lead zirconate titanate thin films by high gas-pressure processing

2008 ◽  
Vol 23 (11) ◽  
pp. 2846-2853 ◽  
Author(s):  
X.D. Zhang ◽  
X.J. Meng ◽  
J.L. Sun ◽  
T. Lin ◽  
J.H. Ma ◽  
...  
Keyword(s):  
Low Temperature ◽  
Lead Zirconate Titanate ◽  
Perovskite Structure ◽  
Hysteresis Loops ◽  
Lead Zirconate ◽  
High Oxygen Pressure ◽  
Low Temperature Preparation ◽  
Pzt Films ◽  
Sputter Deposited ◽  
Temperature Preparation

The Pb(ZrxTi1–x)O3(PZT) films sputter deposited on LaNiO3(LNO)/Si(100) substrates were recrystallized to highly (l00)-oriented perovskite structure by high oxygen-pressure processing (HOPP) and high argon-pressure processing (HAPP), which were performed at a relatively low temperature 400 °C compared to the normally required temperature condition above 600 °C. Ferroelectricity of PZT films was investigated by a measurement of P-E hysteresis loop. The P-E hysteresis loops of the PZT(52/48) and PZT(30/70) films after HOPP showed better squareness and larger remnant polarization than those of as-sputtered ones prepared at a high temperature of 600 °C. Although the PZT films with HAPP also showed a high (l00)-oriented perovskite structure and obvious ferroelectricity, their P-E loops suggested relatively poor ferroelectricity compared to those of the PZT films with HOPP. This means that a further optimization for HAPP is needed to improve ferroelectricity of PZT films.

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