scholarly journals Effect of strain-induced anisotropy on magnetization dynamics in Y3Fe5O12 films recrystallized on a lattice-mismatched substrate

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Adam Krysztofik ◽  
Sevgi Özoğlu ◽  
Robert D. McMichael ◽  
Emerson Coy
Keyword(s):  
Dispersion Model ◽  
Perpendicular Magnetic Anisotropy ◽  
Negative Slope ◽  
Recrystallization Process ◽  
Induced Anisotropy ◽  
Magnetization Dynamics ◽  
Unexpected Formation ◽  
Lattice Matched ◽  
Ferromagnetic Resonance Linewidth ◽  
Lattice Mismatched Substrate

AbstractWe report on the correlation of structural and magnetic properties of Y3Fe5O12 (YIG) films deposited on Y3Al5O12 substrates using pulsed laser deposition. The recrystallization process leads to an unexpected formation of interfacial tensile strain and consequently strain-induced anisotropy contributing to the perpendicular magnetic anisotropy. The ferromagnetic resonance linewidth of YIG is significantly increased in comparison to a film on a lattice-matched Gd3Ga5O12 substrate. Notably, the linewidth dependency on frequency has a negative slope. The linewidth behavior is explained with the proposed anisotropy dispersion model.

Epitaxial TaC Films for the Selective Area Growth of SiC

2008 ◽  
Vol 600-603 ◽  
pp. 183-186 ◽  
Author(s):  
Kenneth A. Jones ◽  
T.S. Zheleva ◽  
R.D. Vispute ◽  
Shiva S. Hullavarad ◽  
M. Ervin ◽  
...  
Keyword(s):  
High Temperature ◽  
Surface Morphology ◽  
Epitaxial Growth ◽  
Lattice Parameter ◽  
Selective Area Growth ◽  
Recrystallization Process ◽  
High Temperature Annealing ◽  
Selective Area ◽  
Area Growth ◽  
Lattice Matched

At sufficiently high temperatures PLD deposited TaC films can be grown epitaxially on 4H-SiC (0001) substrates; at lower temperatures the films recrystallize and ball up forming a large number of pinholes. The growth temperature for epitaxy was found to be 1000°C, and it was facilitated by the epitaxial growth of a thin (2 nm) transition layer of hexagonal Ta2C. High temperature annealing produced changes in the surface morphology, caused grain growth, and created pin holes through a recrystallization process in the films deposited at the lower temperatures, while the films deposited at the higher temperatures remained virtually unchanged. Using TEM it is shown that the (0001) basal planes of the hexagonal 4H-SiC and Ta2C phases are aligned, and they were also parallel to the (111) plane in the cubic TaC with the [101] cubic direction being parallel to the hexagonal [2110] hexagonal direction. The Ta2C interlayer most likely is formed because its lattice parameter in the basel plane (3.103 Ǻ) is intermediate between that of the 4H-SiC (3.08 Ǻ) and the TaC (3.150 Ǻ). Given that Al.5Ga.5N is lattice matched to TaC, it could be an excellent substrate for the growth of GaN/AlGaN heterostructures.

scholarly journals Perpendicular magnetic anisotropy and magnetization dynamics in oxidized CoFeAl films

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Di Wu ◽  
Zhe Zhang ◽  
Le Li ◽  
Zongzhi Zhang ◽  
H. B. Zhao ◽  
...  
Keyword(s):  
Magnetic Anisotropy ◽  
Perpendicular Magnetic Anisotropy ◽  
Magnetization Dynamics

scholarly journals Ferromagnetic Resonance Studies in Magnetic Nanosystems

2021 ◽  
Vol 7 (9) ◽  
pp. 126
Author(s):  
David S. Schmool ◽  
Daniel Markó ◽  
Ko-Wei Lin ◽  
Aurelio Hierro-Rodríguez ◽  
Carlos Quirós ◽  
...  
Keyword(s):  
Thin Films ◽  
Ferromagnetic Resonance ◽  
Magnetic Layer ◽  
Perpendicular Magnetic Anisotropy ◽  
Magnetization Dynamics ◽  
Microwave Spectrometer ◽  
Depth Analysis ◽  
Ferromagnetic Layers ◽  
Recent Developments ◽  
Magnetic Spin

Ferromagnetic resonance is a powerful method for the study of all classes of magnetic materials. The experimental technique has been used for many decades and is based on the excitation of a magnetic spin system via a microwave (or rf) field. While earlier methods were based on the use of a microwave spectrometer, more recent developments have seen the widespread use of the vector network analyzer (VNA), which provides a more versatile measurement system at almost comparable sensitivity. While the former is based on a fixed frequency of excitation, the VNA enables frequency-dependent measurements, allowing more in-depth analysis. We have applied this technique to the study of nanostructured thin films or nanodots and coupled magnetic layer systems comprised of exchange-coupled ferromagnetic layers with in-plane and perpendicular magnetic anisotropies. In the first system, we have investigated the magnetization dynamics in Co/Ag bilayers and nanodots. In the second system, we have studied Permalloy (Ni80Fe20, hereafter Py) thin films coupled via an intervening Al layer of varying thickness to a NdCo film which has perpendicular magnetic anisotropy.

Perpendicular magnetic anisotropy at lattice-matched Co2FeAl/MgAl2O4(001) epitaxial interfaces

2017 ◽  
Vol 110 (11) ◽  
pp. 112403 ◽  
Author(s):  
Hiroaki Sukegawa ◽  
Jason Paul Hadorn ◽  
Zhenchao Wen ◽  
Tadakatsu Ohkubo ◽  
Seiji Mitani ◽  
...  
Keyword(s):  
Magnetic Anisotropy ◽  
Perpendicular Magnetic Anisotropy ◽  
Lattice Matched

Annealing effect on laser-induced magnetization dynamics in Co/Ni-based synthetic antiferromagnets with perpendicular magnetic anisotropy

2019 ◽  
Vol 115 (14) ◽  
pp. 142402 ◽  
Author(s):  
Guanjie Wu ◽  
Shaohai Chen ◽  
Shitao Lou ◽  
Yaowen Liu ◽  
Q. Y. Jin ◽  
...  
Keyword(s):  
Magnetic Anisotropy ◽  
Perpendicular Magnetic Anisotropy ◽  
Annealing Effect ◽  
Magnetization Dynamics

scholarly journals Magnetization Dynamics and Damping for L10-FePd Thin Films with Perpendicular Magnetic Anisotropy

2015 ◽  
Vol 39 (2) ◽  
pp. 57-61 ◽  
Author(s):  
S. Iihama ◽  
M. Khan ◽  
H. Naganuma ◽  
M. Oogane ◽  
T. Miyazaki ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Anisotropy ◽  
Perpendicular Magnetic Anisotropy ◽  
Magnetization Dynamics

TEM Study of Co/Pd and Co/Au Multilayers

1993 ◽  
Vol 51 ◽  
pp. 1036-1037
Author(s):  
A.E.M. De Veirman ◽  
F.J.G. Hakkens ◽  
W.M.J. Coene ◽  
F.J.A. den Broeder
Keyword(s):  
Magnetic Anisotropy ◽  
Ion Beam ◽  
Perpendicular Magnetic Anisotropy ◽  
Optical Recording ◽  
Magnetic Multilayer ◽  
Ion Beam Sputtering ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Beam Sputtering ◽  
Substrate Temperatures

There is currently great interest in magnetic multilayer (ML) thin films (see e.g.), because they display some interesting magnetic properties. Co/Pd and Co/Au ML systems exhibit perpendicular magnetic anisotropy below certain Co layer thicknesses, which makes them candidates for applications in the field of magneto-optical recording. It has been found that the magnetic anisotropy of a particular system strongly depends on the preparation method (vapour deposition, sputtering, ion beam sputtering) as well as on the substrate, underlayer and deposition temperature. In order to get a better understanding of the correlation between microstructure and properties a thorough cross-sectional transmission electron microscopy (XTEM) study of vapour deposited Co/Pd and Co/Au (111) MLs was undertaken (for more detailed results see ref.).The Co/Pd films (with fixed Pd thickness of 2.2 nm) were deposited on mica substrates at substrate temperatures Ts of 20°C and 200°C, after prior deposition of a 100 nm Pd underlayer at 450°C.

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