Effect of strain-induced anisotropy on magnetization dynamics in Y3Fe5O12 films recrystallized on a lattice-mismatched substrate

We report on the correlation of structural and magnetic properties of Y3Fe5O12 (YIG) films deposited on Y3Al5O12 substrates using pulsed laser deposition. The recrystallization process leads to an unexpected formation of interfacial tensile strain and consequently strain-induced anisotropy contributing to the perpendicular magnetic anisotropy. The ferromagnetic resonance linewidth of YIG is significantly increased in comparison to a film on a lattice-matched Gd3Ga5O12 substrate. Notably, the linewidth dependency on frequency has a negative slope. The linewidth behavior is explained with the proposed anisotropy dispersion model.

Температурная зависимость эффективного поля магнитной анизотропии и ширины линии ферромагнитного резонанса поликристаллических сложнозамещенных гексагональных магнитноодноосных ферритов в диапазоне частот 25-67 GHz

In the work in the frequency range 25 – 67 GHz the temperature changes of the effective magnetic anisotropy field and ferromagnetic resonance linewidth of the samples isotropic and anisotropic hexaferrite SrFe11.2Al0.1Si0.15Ca0.15O19 and anisotropic hexaferrite BaFe10.4Al1.4Si0.15Mn0.1O19 were studied. The samples obtained by ceramic technology with the pressing of the raw blanks in a magnetic field of 10 kOe. The studies were carried out in the temperature range+25 – +85 ºC. It was found that in the specified temperature range, the change in magnetic anisotropy is 9.8 Oe/ºC for barium hexaferrite and 4.2 Oe/ºC for strontium hexaferrite, and the change in ferromagnetic resonance linewidth is 12.2 Oe/ºC for barium hexaferrite and 10 – 12.3 Oe/ºC for strontium hexaferrite.