scholarly journals Resolving few-layer antimonene/graphene heterostructures

2021 ◽  
Vol 5 (1) ◽  
Author(s):  
Tushar Gupta ◽  
Kenan Elibol ◽  
Stefan Hummel ◽  
Michael Stöger-Pollach ◽  
Clemens Mangler ◽  
...  
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
Structural Diversity ◽  
Growth Behavior ◽  
Oxide Formation ◽  
Rich Phase ◽  
One Dimensional ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Substrate Properties ◽  
The Rich

AbstractTwo-dimensional (2D) antimony (Sb, “antimonene”) is of interest in electronics and batteries. Sb however exhibits a large allotropic structural diversity, which is also influenced by its support. Thus, Sb heterostructure formation is key in 2D Sb integration. Particularly, 2D Sb/graphene interfaces are important. We thus study here few-layered 2D Sb/graphene heterostructures with atomic resolution (scanning) transmission electron microscopy. We find two Sb morphologies to coexist: first, a 2D morphology of layered β-Sb with β-Sb(001)||graphene(001) texture. Second, one-dimensional Sb nanowires which can be matched to β-Sb[2-21]⊥graphene(001) and are closely related to cubic Sb(001)||graphene(001). Importantly, both Sb morphologies show rotational van-der-Waals epitaxy with graphene. Both are resilient against oxidation, although superficial Sb-oxide formation merits consideration, including epitaxial Sb2O3(111)/β-Sb(001) heterostructures. Exact Sb growth behavior depends on processing and substrate properties including, notably, the support underneath the graphene. Our work elucidates the rich phase and epitaxy landscape in 2D Sb and 2D Sb/graphene heterostructures.

scholarly journals Synthesis and Characterisation of Nanocomposite Mo-Fe-B Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (7) ◽  
pp. 1739
Author(s):  
Paulius Malinovskis ◽  
Stefan Fritze ◽  
Justinas Palisaitis ◽  
Erik Lewin ◽  
Jörg Patscheider ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Scanning Transmission Electron Microscopy ◽  
X Ray Diffraction ◽  
Rich Phase ◽  
X Ray ◽  
Amorphous Phases ◽  
Transmission Electron ◽  
Fe Content ◽  
Direct Current Magnetron Sputtering ◽  
Scanning Transmission

Several ternary phases are known in the Mo-Fe-B system. Previous ab initio calculations have predicted that they should exhibit a tempting mix of mechanical and magnetic properties. In this study, we have deposited Mo-Fe-B films with a Fe-content varying from 0–37 at.% using non-reactive DC (direct current) magnetron sputtering. The phase composition, microstructure, and mechanical properties were investigated using X-ray diffraction, scanning transmission electron microscopy, and nanoindentation measurements. Films deposited at 300 °C and with >7 at.% Fe are nanocomposites consisting of two amorphous phases: a metal-rich phase and a metal-deficient phase. Hardness and elastic modulus were reduced with increasing Fe-content from ~29 to ~19 GPa and ~526 to ~353 GPa, respectively. These values result in H3/E2 ratios of 0.089–0.052 GPa, thereby indicating brittle behaviour of the films. Also, no indication of crystalline ternary phases was observed at temperatures up to 600 °C, suggesting that higher temperatures are required for such films to form.

High-Voltage Scanning Electron Microscopy

1970 ◽  
Vol 28 ◽  
pp. 6-7
Author(s):  
J. M. Cowley
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Wave Optics ◽  
Contrast Effects ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Scanning Transmission ◽  
Types Of Information ◽  
Voltage Scanning

The comparison of scanning transmission electron microscopy (STEM) with conventional transmission electron microscopy (CTEM) can best be made by means of the Reciprocity Theorem of wave optics. In Fig. 1 the intensity measured at a point A’ in the CTEM image due to emission from a point B’ in the electron source is equated to the intensity at a point of the detector, B, due to emission from a point A In the source In the STEM. On this basis it can be demonstrated that contrast effects In the two types of instrument will be similar. The reciprocity relationship can be carried further to include the Instrument design and experimental procedures required to obtain particular types of information. For any. mode of operation providing particular information with one type of microscope, the analagous type of operation giving the same information can be postulated for the other type of microscope. Then the choice between the two types of instrument depends on the practical convenience for obtaining the required Information.

Imaging and diffraction modes in Scanning Transmission Electron Microscopy

1986 ◽  
Vol 44 ◽  
pp. 684-687
Author(s):  
J. M. Cowley ◽  
R. Glaisher ◽  
J. A. Lin ◽  
H.-J. Ou
Keyword(s):  
Scanning Transmission Electron Microscopy ◽  
High Efficiency ◽  
Fiber Optic ◽  
Image Intensifier ◽  
Detector System ◽  
Detector Plane ◽  
Secondary Electrons ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Special Detector

Some of the most important applications of STEM depend on the variety of imaging and diffraction made possible by the versatility of the detector system and the serial nature, of the image acquisition. A special detector system, previously described, has been added to our STEM instrument to allow us to take full advantage of this versatility. In this, the diffraction pattern in the detector plane may be formed on either of two phosphor screens, one with P47 (very fast) phosphor and the other with P20 (high efficiency) phosphor. The light from the phosphor is conveyed through a fiber-optic rod to an image intensifier and TV system and may be photographed, recorded on videotape, or stored digitally on a frame store. The P47 screen has a hole through it to allow electrons to enter a Gatan EELS spectrometer. Recently a modified SEM detector has been added so that high resolution (10Å) imaging with secondary electrons may be used in conjunction with other modes.

Scanning Transmission Electron Microscopy of Polyethylene Crystals

1980 ◽  
Vol 38 ◽  
pp. 242-245
Author(s):  
F. Khoury ◽  
L. H. Bolz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Crystallization Temperature ◽  
Scanning Transmission Electron Microscopy ◽  
Growth Habit ◽  
Lateral Growth ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Growth Habits

The lateral growth habits and non-planar conformations of polyethylene crystals grown from dilute solutions (<0.1% wt./vol.) are known to vary depending on the crystallization temperature.1-3 With the notable exception of a study by Keith2, most previous studies have been limited to crystals grown at <95°C. The trend in the change of the lateral growth habit of the crystals with increasing crystallization temperature (other factors remaining equal, i.e. polymer mol. wt. and concentration, solvent) is illustrated in Fig.l. The lateral growth faces in the lozenge shaped type of crystal (Fig.la) which is formed at lower temperatures are {110}. Crystals formed at higher temperatures exhibit 'truncated' profiles (Figs. lb,c) and are bound laterally by (110) and (200} growth faces. In addition, the shape of the latter crystals is all the more truncated (Fig.lc), and hence all the more elongated parallel to the b-axis, the higher the crystallization temperature.

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