Nanocrystalline, mesoporous NiO/Ce0.9Gd0.1O2−δ thin films with tuned microstructures and electrical properties: in situ characterization of electrical responses during the reduction of NiO
2013 ◽
Vol 1
(36)
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pp. 10753
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1992 ◽
Vol 10
(4)
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pp. 939-944
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Keyword(s):
1988 ◽
Vol 24
(2)
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pp. 1731-1733
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2010 ◽
Vol 30
(2)
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pp. 441-446
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2002 ◽
Vol 16
(28n29)
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pp. 4445-4448
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1997 ◽
Vol 294
(1)
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pp. 67-70
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In situ characterization of plasma‐deposited a‐C:H thin films by spectroscopic infrared ellipsometry
1994 ◽
Vol 65
(9)
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pp. 2882-2889
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