One of the modern trends in the development of communication systems, information and telecommunication systems, air traffic control systems, etc. is the transition and development of higher-frequency wavelength ranges. In this regard more and more stringent requirements (in terms of spectrum, out-of-band and spurious radio emission, and in the shape of the output signal) are imposed on radio engineering devices that transmit and receive microwave radio signals. As a result, the requirements for the design and functional features of microwave electronic devices are increasing. One of these requirements is to assess the degree of compliance with the required values of dielectric properties of materials used in the design of microwave electronic devices. This requirement is justified by the fact that the electrical parameters of such microwave devices as: strip filters, power dividers, printed antennas and others, directly depend on the dielectric properties of the materials used in their substrate designs. In this regard, three main methods have now emerged for assessing the dielectric properties of materials: the resonant method, the non-resonant method, and the free space method. Aim. The aim of this article is to carry out a comparative analysis of the known methods for measuring the dielectric properties of materials in the microwave range of wavelengths and devices for their implementation. Materials and methods. The authors of the article reviewed the scientific literature of domestic and foreign publications. Results. For each of the methods for measuring the dielectric properties of materials, their main idea, practical implementation, a mathematical model for processing experimental data and areas of application are given. The advantages and disadvantages for each of the methods for measuring the dielectric properties of materials are given too. Conclusion. The applicability of each of the considered methods depends on such factors as: the shape of the investigated dielectric material, its state of aggregation, the possibility of measuring amplitude or complex transmission and reflection coefficients, the presence of an anechoic chamber, etc.
Piezoelectric and Dielectric Properties of Low Temperature Sintering (K0.5Na0.5)NbO3Ceramics with the Variation of Poling Electric Field
