scholarly journals Analysis of methods for measuring the dielectric properties of materials in the microwave range of wavelengths.

Author(s):  
D.G. Fomin ◽  
◽  
N.V. Dudarev ◽  
S.N. Darovskikh ◽  
◽  
...  

One of the modern trends in the development of communication systems, information and telecommunication systems, air traffic control systems, etc. is the transition and development of higher-frequency wavelength ranges. In this regard more and more stringent requirements (in terms of spectrum, out-of-band and spurious radio emission, and in the shape of the output signal) are imposed on radio engineering devices that transmit and receive microwave radio signals. As a result, the requirements for the design and functional features of microwave electronic devices are increasing. One of these requirements is to assess the degree of compliance with the required values of dielectric properties of materials used in the design of microwave electronic devices. This requirement is justified by the fact that the electrical parameters of such microwave devices as: strip filters, power dividers, printed antennas and others, directly depend on the dielectric properties of the materials used in their substrate designs. In this regard, three main methods have now emerged for assessing the dielectric properties of materials: the resonant method, the non-resonant method, and the free space method. Aim. The aim of this article is to carry out a comparative analysis of the known methods for measuring the dielectric properties of materials in the microwave range of wavelengths and devices for their implementation. Materials and methods. The authors of the article reviewed the scientific literature of domestic and foreign publications. Results. For each of the methods for measuring the dielectric properties of materials, their main idea, practical implementation, a mathematical model for processing experimental data and areas of application are given. The advantages and disadvantages for each of the methods for measuring the dielectric properties of materials are given too. Conclusion. The applicability of each of the considered methods depends on such factors as: the shape of the investigated dielectric material, its state of aggregation, the possibility of measuring amplitude or complex transmission and reflection coefficients, the presence of an anechoic chamber, etc.

2021 ◽  
Vol 8 ◽  
pp. 101-110
Author(s):  
D.G. Fomin ◽  
N.V. Dudarev ◽  
S.N. Darovskikh ◽  
D.S. Klygach ◽  
M.G. Vakhitov

Statement of the problem: One of the actual problems of applying radio materials at high and ultrahigh frequency ranges is the problem of increased requirements for the accuracy of assessing their dielectric properties. Currently, non-resonant and resonant methods are applied to assess the dielectric properties of radio materials at the frequency ranges indicated above. Non-resonant methods are expedient for application in non-destructive testing of large-area sheet materials. Their implementation requires the application of an expensive vector network analyzer. Resonant methods are applied with a limited amount of the test material or in its powder state. In the implementation of resonant methods the main investigated parameter is the displacement of the frequency of the electrical resonance. As a consequence, only the amplitude values of the transmission and reflection coefficients need to be known. This feature makes it possible to carry out microwave measurements for the resonant method applying a scalar network analyzer which has a lower cost compared to a vector network analyzer. That feature is an advantage in some cases. One of the promising directions in the development of the resonant measurement method is its implementation based on applying of a volumetric-modular technology. In particular its implementation that based on application of a multilayer strip-slot transition. The problem with this approach is the lack of researches in terms of the effectiveness of the application of the multilayer strip-slot transition as a device with a tunable frequency of electrical resonance. Aim: The aim of this article is to present a resonant method based on the application of the multilayer strip-slot transition as a basic measuring device. Such a design solution for the implementation of resonant microwave measurements has no analogues. This determined the conduction of current research. The task of which is to theoretically and experimentally substantiate the effectiveness of applying a multilayer strip-slot transition to implement the resonant method for measuring the dielectric properties of materials. Results: The results of theoretical and experimental studies of the resonance properties of the multilayer strip-slot transition are presented. Its application makes it possible to realize an original volume-modular device for the resonant method of measuring the dielectric parameters of materials in the microwave range of wavelengths. The theoretical research is based on the development of an equivalent circuit, which is presented in the form of a cascade connection of four-port networks. The results of mathematical simulation of the multilayer strip-slot transition prove the possibility of implementing on its basis the resonance method for measuring the dielectric parameters of materials in the microwave range of wavelengths. Experimental studies were carried out on a sample of a volume-modular device with the multilayer strip-slot transition. The test material was a powder representing barium hexaferrite BaFe10Ti2O19 partially substituted by titanium. The coincidence of the results of mathematical simulation and experimental studies of the frequency-selective properties of a multilayer strip-slot transition is more than 95%. The error in assessing the permittivity of the used powder material based on the results of theoretical and experimental studies does not exceed 4.5%. Practical significance: The results of the research showed the possibility of applying of the multilayer strip-slot transition as a basic element for the implementation of the resonance method for measuring the dielectric properties of materials. The advantages of the proposed design are compactness and the ability to measure the dielectric properties of powder materials using scalar network analyzers.


2021 ◽  
Vol 5 (2) ◽  
pp. 91-103
Author(s):  
D. G. Fomin ◽  
◽  
N. V. Dudarev ◽  
S. N. Darovskikh ◽  
M. G. Vakhitov ◽  
...  

State of problem. Today a significant part of passive microwave electronic devices is implemented in the form of single-layer structures. In some cases, such approach leads to an increase in the overall dimension’s characteristics of electronic equipment. Moreover, the application of single-layer microwave boards leads to the complexity of replacing individual functional units. Therefore, the replacement of the entire microwave board is required to improve any of its functional part. It is nonprofit economically and inefficient technologically. Significant progress in eliminating the above-mentioned disadvantages may be achieved by the application of volume-modular technology of design microwave electronic devices. Purpose. The purpose of the research is to present a brief overview of the features of the application of volume-modular technology in the design of microwave electronic devices of modern radio-electronic equipment. The volume-modular way of implementing microwave devices is described. It allows improving their weight and overall dimension characteristics and at the same time maintaining and increasing their functionality. The basic principles of design of volume modular microwave electronic devices are formulated. The results of numerical simulation of the electrodynamics characteristics of a strip-slot transition are presented. The method for quantitative assessment of the influence of volume-modular technology on the weight and dimensions characteristics of microwave electronic devices is considered. The main advantages and disadvantages of volume-modular technology are listed. Results. We demonstrate a possibility of reducing the overall dimensions characteristics of passive microwave electronic devices by more than 10 times while maintaining their electrical parameters. Each component is presented in the form of a structurally separate and complete board with unified overall and connecting dimensions. The standard electromagnetic coupling between functional parts makes it possible to assemble microwave electronic devices with specified electrodynamics characteristics from the base elements.


2021 ◽  
Vol 5 (3) ◽  
pp. 225-238
Author(s):  
D. G. Fomin ◽  
◽  
N. V. Dudarev ◽  
S. N. Darovskikh ◽  
◽  
...  

The paper presents the results of theoretical and experimental researches of a frequency-tunable device based on the multilayer strip-slot transition with the U-shaped slot resonator of the variable length. The application of the presented device makes it possible to implement a resonant method for measuring the dielectric properties of materials in the microwave frequency range. The numerical simulation in the rigorous formulation of the electrodynamics problem is performed for the theoretical research. The aim of the theoretical research is to determine the electrical characteristics of the multilayer strip-slot transition with the U-shaped slot resonator of the variable length. The results of numerical simulation prove the possibility of applying the multilayer stripslot transition with the U-shaped slot resonator of the variable length to implement the resonant method for measuring the dielectric properties of materials in the microwave frequency range. The experimental research is performed on the sample of the multilayer strip-slot transition with the U-shaped slot resonator of the variable length in the frequency range (850–1250) MHz. Measurements of S-parameters of the multilayer strip-slot transition with the U-shaped slot resonator of the variable length are accomplished using the vector network analyzer. The material under research is BaFe10Ti2O19. The results of theoretical and experimental researches are in good qualitative and quantitative agreement.


1989 ◽  
Vol 167 ◽  
Author(s):  
G. Arjavalingam ◽  
Y. Pastol ◽  
J.-M. Halbout ◽  
G. V. Kopcsay

There is considerable recent interest in the dielectric properties of materials measured over broad electrical bandwidths. This follows from advances made in the performance of electronic devices which now produce pulses with risetimes in the order of 5 picoseconds. It is essential to know the dielectric constants and loss properties of the materials used in fabricating these devices and their interconnection structures, up to frequencies of about 100 GHz. Moreover, such information will be invaluable for the effective use of microwaves in materials processing [1]. The curing of polymers and the sintering of ceramics are two examples. Here, we discuss the recently developed coherent microwave transient spectroscopy (COMITS) technique which measures the complex dielectric constants of materials, from 10 GHz to about 125 GHz, in a single experiment [2,3].


2019 ◽  
pp. 55-59 ◽  
Author(s):  
V. N. Semenenko ◽  
◽  
V. A. Chistyaev ◽  
A. A. Politiko ◽  
K. M. Baskov ◽  
...  

Author(s):  
Arthur Marronnier ◽  
Heejae Lee ◽  
Bernard Geffroy ◽  
Yvan Bonnassieux ◽  
Jacky Even ◽  
...  

Author(s):  
R. Gangradey ◽  
J. Mishra ◽  
S. Mukherjee ◽  
P. Nayak ◽  
P. Panchal ◽  
...  

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