Probing the correlation between structure, carrier dynamics and defect states of epitaxial GaN film on (112̄0) sapphire grown by rf-molecular beam epitaxy
Keyword(s):
A systematic study has been performed to correlate structural, optical and electrical properties with defect states in the GaN films grown on a-plane (112̄0) sapphire substrate via rf-plasma molecular beam epitaxy.
2004 ◽
Vol 43
(No. 12A)
◽
pp. L1537-L1539
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2013 ◽
Vol 378
◽
pp. 180-183
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Keyword(s):