Life-cycling and uncovering cation-trapping evidence of a monolithic inorganic electrochromic device: glass/ITO/WO3/LiTaO3/NiO/ITO

Dongmei Dong; Wenwen Wang; Aline Rougier; Guobo Dong; Mathias Da Rocha; Lionel Presmanes; Khawla Zrikem; Giljoo Song; Xungang Diao; Antoine Barnabé

doi:10.1039/c8nr02267d

Life-cycling and uncovering cation-trapping evidence of a monolithic inorganic electrochromic device: glass/ITO/WO3/LiTaO3/NiO/ITO

Nanoscale ◽

10.1039/c8nr02267d ◽

2018 ◽

Vol 10 (35) ◽

pp. 16521-16530 ◽

Cited By ~ 17

Author(s):

Dongmei Dong ◽

Wenwen Wang ◽

Aline Rougier ◽

Guobo Dong ◽

Mathias Da Rocha ◽

...

Keyword(s):

Emission Spectroscopy ◽

Optical Emission Spectroscopy ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Optical Emission ◽

Electrochromic Device ◽

Combined Approach ◽

Lithium Transport ◽

Secondary Ion

The visualization of the microstructure change and of the depth of lithium transport inside a monolithic ElectroChromic Device (ECD) is realized using an innovative combined approach of Focused Ion Beam (FIB), Secondary Ion Mass Spectrometry (SIMS) and Glow Discharge Optical Emission Spectroscopy (GDOES).

Download Full-text

Focused ion beam induced optical emission spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.584130 ◽

1988 ◽

Vol 6 (6) ◽

pp. 2100 ◽

Cited By ~ 3

Author(s):

B. W. Ward

Keyword(s):

Emission Spectroscopy ◽

Optical Emission Spectroscopy ◽

Focused Ion Beam ◽

Ion Beam ◽

Optical Emission

Download Full-text

Comparison of the Spectra of LiCoO2, CoO, and Co3O4 by Time-of-Flight Secondary Ion Mass Spectrometry with Focused Ion Beam (FIB-TOF-SIMS)

Journal of the Vacuum Society of Japan ◽

10.3131/jvsj2.56.122 ◽

2013 ◽

Vol 56 (4) ◽

pp. 122-124 ◽

Cited By ~ 2

Author(s):

Miwa OHNISHI ◽

Osamu MATSUOKA ◽

Hidenobu NOGI ◽

Tetsuo SAKAMOTO

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

A New Focused Ion Beam Optical System for a Time-of-flight-Secondary Ion Mass Spectrometry Instrument

Rapid Communications in Mass Spectrometry ◽

10.1002/(sici)1097-0231(19970131)11:2<175::aid-rcm725>3.0.co;2-k ◽

1997 ◽

Vol 11 (2) ◽

pp. 175-178 ◽

Cited By ~ 4

Author(s):

H. Shichi ◽

S. Osabe ◽

K. Kanehori

Keyword(s):

Mass Spectrometry ◽

Optical System ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Time Of Flight ◽

Mass Spectrometry Instrument ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Combined Secondary Ion Mass Spectrometry Depth Profiling and Focused Ion Beam Analysis of Cu Films Electrodeposited under Oscillatory Conditions

ChemElectroChem ◽

10.1002/celc.201402427 ◽

2015 ◽

Vol 2 (5) ◽

pp. 664-671 ◽

Cited By ~ 9

Author(s):

Nguyen T. M. Hai ◽

David Lechner ◽

Florian Stricker ◽

Julien Furrer ◽

Peter Broekmann

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Depth Profiling ◽

Ion Beam Analysis ◽

Cu Films ◽

Beam Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Secondary ion mass spectrometry depth profiling of nanometer-scale p+-n junctions fabricated by Ga+ focused ion beam implantation

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586355 ◽

1992 ◽

Vol 10 (1) ◽

pp. 333 ◽

Cited By ~ 14

Author(s):

Steven W. Novak

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Depth Profiling ◽

Nanometer Scale ◽

Ion Beam Implantation ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Combined electron and focused ion beam system for improvement of secondary ion yield in secondary ion mass spectrometry instrument

Applied Physics Letters ◽

10.1063/1.2362996 ◽

2006 ◽

Vol 89 (16) ◽

pp. 164103 ◽

Cited By ~ 1

Author(s):

L. Ji ◽

Q. Ji ◽

K.-N. Leung ◽

R. A. Gough

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Mass Spectrometry Instrument ◽

Beam System ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Visualization of deuterium flux and grain boundary diffusion in duplex stainless steel and Fe–30 % Ni alloy, using secondary ion mass spectrometry equipped with a Ga focused ion beam

Journal of Materials Science ◽

10.1007/s10853-013-7956-7 ◽

2013 ◽

Vol 49 (11) ◽

pp. 3928-3935 ◽

Cited By ~ 13

Author(s):

Tomohito Tanaka ◽

Kazuto Kawakami ◽

Shun-ichi Hayashi

Keyword(s):

Mass Spectrometry ◽

Stainless Steel ◽

Grain Boundary ◽

Focused Ion Beam ◽

Boundary Diffusion ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Ni Alloy ◽

Deuterium Flux ◽

Secondary Ion

Download Full-text

Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry

Japanese Journal of Applied Physics ◽

10.1143/jjap.36.1287 ◽

1997 ◽

Vol 36 (Part 1, No. 3A) ◽

pp. 1287-1291 ◽

Cited By ~ 5

Author(s):

Tetsuo Sakamoto ◽

Masanori Owari ◽

Yoshimasa Nihei

Keyword(s):

Mass Spectrometry ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Charge neutralization using secondary electron shower for shave-off depth profiling by focused ion beam secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.103 ◽

2008 ◽

Vol 255 (4) ◽

pp. 1351-1353

Author(s):

Y. Ishizaki ◽

T. Yamamoto ◽

M. Fujii ◽

M. Owari ◽

M. Nojima ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Electron ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Depth Profiling ◽

Charge Neutralization ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Electron Shower

Download Full-text

Focused ion beam-secondary ion mass spectrometry analyses of nanostructured thin films

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2003.10.079 ◽

2004 ◽

Vol 180-181 ◽

pp. 323-330 ◽

Cited By ~ 6

Author(s):

A. Lamperti ◽

C.E. Bottani ◽

P.M. Ossi ◽

R. Levi-Setti

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Focused Ion Beam ◽

Secondary Ion Mass Spectrometry ◽

Ion Beam ◽

Nanostructured Thin Films ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text