Stable field-emission from a CeB6 nanoneedle point electron source

Nanoscale ◽  
2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Yimeng Wu ◽  
You-Hu Chen ◽  
Jun Uzuhashi ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Emission Current ◽  
Field Emission Current ◽  
Stable Field ◽  
Single Emission

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.

scholarly journals A stable LaB6 nanoneedle field-emission point electron source

2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Jun Uzuhashi ◽  
Tadakatsu Ohkubo ◽  
Wataru Hayami ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Energy Spread ◽  
Next Generation ◽  
Small Energy ◽  
Emission Point ◽  
Emission Stability ◽  
High Emission

A LaB6 nanoneedle that is fabricated using a focused ion beam shows a high reduced brightness, small energy spread, and especially high emission stability. It can now be used practically as a next-generation field-emission point electron source.

Critical fluctuations of the field emission current

1994 ◽  
Vol 317 (1-2) ◽  
pp. 253-258 ◽  
Author(s):  
E.S. Shikhovtseva ◽  
K. Skwarek ◽  
J. Bȩben
Keyword(s):  
Field Emission ◽  
Emission Current ◽  
Critical Fluctuations ◽  
Field Emission Current

Measurement of field emission current variations caused by an amplitude modulated laser

2002 ◽  
Vol 327 (1) ◽  
pp. 7-15 ◽  
Author(s):  
M Brugat ◽  
M.S Mousa ◽  
E.P Sheshin ◽  
M.J Hagmann
Keyword(s):  
Field Emission ◽  
Emission Current ◽  
Field Emission Current

Growth Mechanism and Field Emission Characteristics of GaO/GaN Nanotips Using Iodine-assisted Enhanced Focused Ion Beam Etching

2011 ◽  
Vol 7 (4) ◽  
pp. 594-597
Author(s):  
Zhan-Shuo Hu ◽  
Fei-Yi Hung ◽  
Shoou-Jinn Chang ◽  
Bohr-Ran Huang ◽  
Bo-Cheng Lin ◽  
...  
Keyword(s):  
Field Emission ◽  
Growth Mechanism ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Emission Characteristics ◽  
Ion Beam Etching

scholarly journals Relativistic Correction of the Field Emission Current in the Fowler-Nordheim Formalism

2019 ◽  
Vol 11 (2) ◽  
pp. 02022-1-02022-6 ◽  
Author(s):  
S. O. Lebedynskyi ◽  
◽  
O. O. Pasko ◽  
R. I. Kholodov ◽  
◽  
...  
Keyword(s):  
Field Emission ◽  
Relativistic Correction ◽  
Emission Current ◽  
Field Emission Current
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