scholarly journals A stable LaB6 nanoneedle field-emission point electron source

2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Jun Uzuhashi ◽  
Tadakatsu Ohkubo ◽  
Wataru Hayami ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Energy Spread ◽  
Next Generation ◽  
Small Energy ◽  
Emission Point ◽  
Emission Stability ◽  
High Emission

A LaB6 nanoneedle that is fabricated using a focused ion beam shows a high reduced brightness, small energy spread, and especially high emission stability. It can now be used practically as a next-generation field-emission point electron source.

Stable field-emission from a CeB6 nanoneedle point electron source

Nanoscale ◽  
2021 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Yimeng Wu ◽  
You-Hu Chen ◽  
Jun Uzuhashi ◽  
...  
Keyword(s):  
Field Emission ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Electron Source ◽  
Emission Current ◽  
Field Emission Current ◽  
Stable Field ◽  
Single Emission

A single CeB6 nanoneedle structure has been fabricated using a focused ion beam (FIB) and it shows an excellent field emission current stability as well as a single emission spot.

A controllable and efficient method for the fabrication of a single HfC nanowire field-emission point electron source aided by low keV FIB milling

Nanoscale ◽  
2020 ◽  
Vol 12 (32) ◽  
pp. 16770-16774 ◽  
Author(s):  
Shuai Tang ◽  
Jie Tang ◽  
Ta-Wei Chiu ◽  
Jun Uzuhashi ◽  
Dai-Ming Tang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Field Emission ◽  
Atom Probe Tomography ◽  
High Performance ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Atom Probe ◽  
Emission Measurement ◽  
Hafnium Carbide ◽  
Emission Point

A high-performance single hafnium carbide (HfC) nanowire field-induced electron emitter, sharpened with focused ion beam (FIB), is characterized by electron microscopy, atom probe tomography, and field-emission measurement.

Growth Mechanism and Field Emission Characteristics of GaO/GaN Nanotips Using Iodine-assisted Enhanced Focused Ion Beam Etching

2011 ◽  
Vol 7 (4) ◽  
pp. 594-597
Author(s):  
Zhan-Shuo Hu ◽  
Fei-Yi Hung ◽  
Shoou-Jinn Chang ◽  
Bohr-Ran Huang ◽  
Bo-Cheng Lin ◽  
...  
Keyword(s):  
Field Emission ◽  
Growth Mechanism ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Emission Characteristics ◽  
Ion Beam Etching

WO3 nanowire field emission point electron source with high brightness and current stability

Vacuum ◽  
2021 ◽  
pp. 110660
Author(s):  
Zufang Lin ◽  
Huanjun Chen ◽  
Juncong She ◽  
Shaozhi Deng ◽  
Jun Chen
Keyword(s):  
Field Emission ◽  
Electron Source ◽  
High Brightness ◽  
Emission Point

Effects of Hydrogen Post Treatment and Duty Factor on Carbon Nanotube Field Emission Stability

2006 ◽  
Vol 963 ◽  
Author(s):  
Sigen Wang ◽  
Sha Chang
Keyword(s):  
Field Emission ◽  
Hydrogen Plasma ◽  
Post Treatment ◽  
Emission Current ◽  
Duty Factor ◽  
Electron Sources ◽  
Emission Stability ◽  
High Emission ◽  
Microwave Power Amplifier ◽  
Stable Field

ABSTRACTCarbon nanotubes (CNTs) have been investigated as field emission electron sources for a number of applications such as x-ray source and microwave power amplifier. These applications often require that nanotubes provide a stable field emission at a high emission current. In this paper, we investigated the emission stability of CNTs as functions of hydrogen post-treatment and duty factor. The experimental results show that the hydrogen plasma treatment and a reduced duty cycle from 100% to 35% can noticeably improve the emission stability of CNTs at a high current value of 4 mA. Our study also shows that emission induced anode heating at high duty factor and high emission current level degrades vacuum level and thus the emission stability of CNTs.

Sign in / Sign up

Export Citation Format

Share Document