Gate oxide thickness dependence of high-field-induced interface state generation in thin thermal oxides

1990 ◽  
Vol 26 (15) ◽  
pp. 1124 ◽  
Author(s):  
G.Q. Lo ◽  
D.L. Kwong
Keyword(s):  
High Field ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Interface State ◽  
Thickness Dependence ◽  
Gate Oxide Thickness ◽  
State Generation

Gate Oxide Thickness Dependence of Intrinsic Gain and Flicker Noise in InGaZnO Thin Film Transistors

2013 ◽  
Author(s):  
T. Morooka ◽  
K. Fukase ◽  
S. Nakano ◽  
S. Toriyama ◽  
H. Momose ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Flicker Noise ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Thickness Dependence ◽  
Gate Oxide Thickness ◽  
Intrinsic Gain

Gate oxide thickness dependence of the leakage current mechanism in Ru/Ta2O5/SiON/Si structures

2010 ◽  
Vol 25 (7) ◽  
pp. 075007 ◽  
Author(s):  
M Ťapajna ◽  
A Paskaleva ◽  
E Atanassova ◽  
E Dobročka ◽  
K Hušeková ◽  
...  
Keyword(s):  
Leakage Current ◽  
Gate Oxide ◽  
Oxide Thickness ◽  
Thickness Dependence ◽  
Gate Oxide Thickness ◽  
Leakage Current Mechanism ◽  
Current Mechanism

Analysis on gate-oxide thickness dependence of hot-carrier-induced degradation in thin-gate oxide nMOSFET's

1990 ◽  
Vol 37 (6) ◽  
pp. 1496-1503 ◽  
Author(s):  
Y. Toyoshima ◽  
H. Iwai ◽  
F. Matsuoka ◽  
H. Hayashida ◽  
K. Maeguchi ◽  
...  
Keyword(s):  
Gate Oxide ◽  
Oxide Thickness ◽  
Thickness Dependence ◽  
Hot Carrier ◽  
Gate Oxide Thickness ◽  
Thin Gate Oxide

Gate Oxide Thickness Dependence of Hot Carrier Induced Degradation on PMOSFETs

ESSDERC ’89 ◽  
1989 ◽  
pp. 732-735 ◽  
Author(s):  
Y. Hiruta ◽  
H. Oyamatsu ◽  
H. S. Momose ◽  
H. Iwai ◽  
K. Maeguchi
Keyword(s):  
Gate Oxide ◽  
Oxide Thickness ◽  
Thickness Dependence ◽  
Hot Carrier ◽  
Gate Oxide Thickness

Gate-oxide thickness dependence of LDD MOSFET parameters

1997 ◽  
Vol 41 (8) ◽  
pp. 1199-1201 ◽  
Author(s):  
Md.R Hassan ◽  
J.J Liou ◽  
A Ortiz-Conde
Keyword(s):  
Gate Oxide ◽  
Oxide Thickness ◽  
Thickness Dependence ◽  
Gate Oxide Thickness
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