ESSDERC ’89
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TOTAL DOCUMENTS

199
(FIVE YEARS 0)

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6
(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783642523168, 9783642523144
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Crack Formation and Selective Growth in MOVPE-GaAs on Si and its Application to OEICs

ESSDERC ’89 ◽  
1989 ◽  
pp. 397-400
Author(s):  
A. Ackaert ◽  
L. Buydens ◽  
D. Lootens ◽  
P. Van Daele ◽  
P. Demeester
Keyword(s):  
Crack Formation ◽  
Selective Growth ◽  
Gaas On Si

Progress in Optoelectronic ICs

ESSDERC ’89 ◽  
1989 ◽  
pp. 329-342
Author(s):  
D. Decoster ◽  
J. P. Vilcot

A Novel Approach to Realistic Worst-case Simulations of CMOS Circuits

ESSDERC ’89 ◽  
1989 ◽  
pp. 310-313 ◽  
Author(s):  
M. J. B. Bolt ◽  
J. Engel ◽  
M. Rocchi ◽  
A. van Steenwijk
Keyword(s):  
Cmos Circuits ◽  
Worst Case ◽  
Novel Approach

Numerical Simulation of Gas Flow and Temperature in a Diffusion Furnace

ESSDERC ’89 ◽  
1989 ◽  
pp. 302-305 ◽  
Author(s):  
S. Howell ◽  
J. I. Ulacia F. ◽  
Ch. Werner
Keyword(s):  
Numerical Simulation ◽  
Gas Flow

High Speed Ga0.47In0.53As MISFETs Grown by Metal Organic Vapor Phase Epitaxy

ESSDERC ’89 ◽  
1989 ◽  
pp. 267-270
Author(s):  
J. Splettstößer ◽  
F. Schulte ◽  
A. Trasser ◽  
D. Schmitz ◽  
H. Beneking
Keyword(s):  
Vapor Phase ◽  
High Speed ◽  
Vapor Phase Epitaxy ◽  
Organic Vapor ◽  
Metal Organic

A Yield Modelling System for NMOS and CMOS IC

ESSDERC ’89 ◽  
1989 ◽  
pp. 210-213
Author(s):  
He Yie ◽  
Shen Yanhui
Keyword(s):  
Cmos Ic ◽  
Modelling System
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