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Supply current testing in linear bipolar ICs
Electronics Letters
◽
10.1049/el:19940088
◽
1994
◽
Vol 30
(2)
◽
pp. 128-130
◽
Cited By ~ 17
Author(s):
D.K. Papakostas
◽
A.A. Hatzopoulos
Keyword(s):
Current Testing
◽
Supply Current
Download Full-text
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Pin open detection of BGA IC by supply current testing
2014 International Conference on Electronics Packaging (ICEP)
◽
10.1109/icep.2014.6826695
◽
2014
◽
Author(s):
Akira Ono
◽
Hiroyuki Yotsuyanagi
◽
Masaki Hashizume
Keyword(s):
Current Testing
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Supply Current
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Power supply current testing in the production line of emergency luminaire circuits
2008 15th IEEE International Conference on Electronics, Circuits and Systems
◽
10.1109/icecs.2008.4674969
◽
2008
◽
Cited By ~ 1
Author(s):
Michael G. Dimopoulos
◽
Dimitris K. Papakostas
◽
Alexios D. Spyronasios
◽
Alkis A. Hatzopoulos
◽
Dimitrios K. Konstantinou
Keyword(s):
Power Supply
◽
Production Line
◽
Current Testing
◽
Supply Current
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Test input vectors for supply current testing of TTL combinational circuits
Proceedings First Asian Test Symposium (ATS `92)
◽
10.1109/ats.1992.224436
◽
2003
◽
Cited By ~ 4
Author(s):
M. Hashizume
◽
T. Tamesada
◽
I. Tsukimoto
Keyword(s):
Combinational Circuits
◽
Current Testing
◽
Test Input
◽
Supply Current
Download Full-text
Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing
Second IEEE International Workshop on Electronic Design, Test and Applications
◽
10.1109/delta.2004.10031
◽
2005
◽
Cited By ~ 3
Author(s):
S. Thomas
◽
R. Makki
◽
Sai Kishore Vavilala
Keyword(s):
Current Testing
◽
Measurement And Analysis
◽
Supply Current
◽
Physical Defects
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A built-in test circuit for supply current testing of open defects at interconnects in 3D ICs
2012 4th Electronic System-Integration Technology Conference
◽
10.1109/estc.2012.6542127
◽
2012
◽
Cited By ~ 10
Author(s):
Tomoaki Konishi
◽
Hiroyuki Yotsuyanagi
◽
Masaki Hashizume
Keyword(s):
Current Testing
◽
3D Ics
◽
Test Circuit
◽
Supply Current
◽
Open Defects
Download Full-text
Random current testing for CMOS logic circuits by monitoring a dynamic power supply current
Proceedings EURO-DAC '92: European Design Automation Conference
◽
10.1109/eurdac.1992.246200
◽
2003
◽
Author(s):
H. Tamamoto
◽
H. Yokoyama
◽
Y. Narita
Keyword(s):
Power Supply
◽
Logic Circuits
◽
Dynamic Power
◽
Current Testing
◽
Supply Current
◽
Dynamic Power Supply Current
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Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs
ETRI Journal
◽
10.4218/etrij.01.0101.0205
◽
2001
◽
Vol 23
(2)
◽
pp. 77-84
◽
Cited By ~ 14
Author(s):
Doe-Hyun Yoon Yoon
◽
Hong-Sik Kim Kim
◽
Sungho Kang Kang
Keyword(s):
Power Supply
◽
Dynamic Power
◽
Current Testing
◽
Supply Current
◽
Open Defects
◽
Dynamic Power Supply Current
Download Full-text
A current testing for CMOS logic circuits applying random patterns and monitoring dynamic power supply current
Proceedings First Asian Test Symposium (ATS `92)
◽
10.1109/ats.1992.224438
◽
2003
◽
Cited By ~ 7
Author(s):
H. Tamamoto
◽
H. Yokoyama
◽
Y. Narita
Keyword(s):
Power Supply
◽
Logic Circuits
◽
Dynamic Power
◽
Current Testing
◽
Supply Current
◽
Random Patterns
◽
A Current
◽
Dynamic Power Supply Current
Download Full-text
Application of supply current testing to analogue circuits, towards a structural analogue test methodology
European Test Workshop 1999 (Cat. No.PR00390)
◽
10.1109/etw.1999.804221
◽
2003
◽
Cited By ~ 7
Author(s):
H. Manhaeve
◽
J. Verfaillie
◽
B. Straka
◽
J.P. Cornil
Keyword(s):
Structural Analogue
◽
Current Testing
◽
Test Methodology
◽
Analogue Circuits
◽
Supply Current
Download Full-text
Dynamic supply current testing of analog circuits using wavelet transform
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)
◽
10.1109/vts.2002.1011158
◽
2003
◽
Cited By ~ 16
Author(s):
S. Bhunia
◽
K. Roy
Keyword(s):
Wavelet Transform
◽
Analog Circuits
◽
Current Testing
◽
Supply Current
Download Full-text
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