Dark-currents characterisation in charge-coupled devices

1978 ◽  
Vol 2 (6) ◽  
pp. 199
Author(s):  
P.A. Gargini ◽  
C. Morandi ◽  
P.E. Rambelli
Keyword(s):  
Charge Coupled Devices ◽  
Dark Currents

Transform coding using charge-coupled devices

1977 ◽  
Vol 13 (10) ◽  
pp. 277 ◽  
Author(s):  
J.B.G. Roberts ◽  
E.H. Darlington ◽  
R.D. Edwards ◽  
R.F. Simons
Keyword(s):  
Transform Coding ◽  
Charge Coupled Devices

Analysis of dislocations and their correlation with dark currents in CdTe/Si heterojunction diode-type x-ray detectors

2021 ◽  
Vol 130 (5) ◽  
pp. 055302
Author(s):  
B. S. Chaudhari ◽  
H. Goto ◽  
M. Niraula ◽  
K. Yasuda
Keyword(s):  
Heterojunction Diode ◽  
X Ray ◽  
Dark Currents

Operation, Performance, And Reliability Testing Of Charge-Coupled Devices For Star Trackers

1987 ◽  
Vol 26 (8) ◽  
Author(s):  
Gordon R. Hopkinson ◽  
R. A. Cockshott ◽  
D. J. Purll ◽  
M. D. Skipper ◽  
B. Taylor
Keyword(s):  
Reliability Testing ◽  
Operation Performance ◽  
Charge Coupled Devices

Response of charge‐coupled devices to direct electron bombardment

1989 ◽  
Vol 60 (6) ◽  
pp. 1095-1103 ◽  
Author(s):  
D. G. Stearns ◽  
J. D. Wiedwald
Keyword(s):  
Electron Bombardment ◽  
Charge Coupled Devices

Effect of AlN film thickness on photo/dark currents of MSM UV photodetector

2008 ◽  
Vol 50 (11) ◽  
pp. 2863-2866 ◽  
Author(s):  
Ru-Yuan Yang ◽  
Chin-Min Hsiung ◽  
Hsuan-Hsu Chen ◽  
Hung-Wei Wu ◽  
Ming-Chang Shih
Keyword(s):  
Film Thickness ◽  
Uv Photodetector ◽  
Aln Film ◽  
Dark Currents
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