The scanning electron microscope and other electron-probe instruments

1975 ◽  
Vol 122 (9) ◽  
pp. 942
Author(s):  
Charles Oatley
Author(s):  
David Joy ◽  
James Pawley

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact point. A third limitation emerges from the fact that the probing beam is composed of a finite number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller).


1993 ◽  
Vol 36 (12) ◽  
pp. 1348-1350
Author(s):  
Yu. A. Novikov ◽  
A. V. Rakov ◽  
I. Yu. Stekolin ◽  
I. B. Strizhkov

Author(s):  
P. Lublin ◽  
V. J. Fowler ◽  
J. Schlafer

The advantages of color recording in the scanning electron microscope and the electron probe have been previously enumerated. The usual method of recording scanned images from these instruments is by photographing the display from a long-persistence black and white cathode ray tube. Previous attempts at color recording have included a variety of methods utilizing color filters, density traces, and color cathode ray tubes. These methods present difficulties in super-imposition of sequential images and/or poor resolution. Resolution of the cathode ray tube is particularly important in scanning electron microscopy.A new recorder providing high-resolution color micrographs for both the electron probe and the scanning electron microscope has been constructed. This instrument employs a multi-color laser which is scanned in synchronism with the electron beam in the column to give a point-to-point correlation.


Author(s):  
K. Ogura ◽  
A. Ono ◽  
M. M. Kersker

In general, various improvements have been made to SEM vacuum systems, and clean high vacuum specimen chambers are now routinely available. However, in the ultra high resolution scanning electron microscope, the prevention or reduction of contamination on the specimen surface has recently become an important subject when SEM imaging is done at higher than 200,000x magnification using a very fine electron probe. Typically, the specimen carries hydrocarbon gas molecules which are the source of the contamination, into the SEM. They adhere not only to the specimen surface but may also incorporated in the specimen, most typically in biological specimens, and cannot be reduced by the anti-contamination device of the SEM. Recently, a specimen heating holder was used in a JSM-890 ultra high resolution SEM, to reduce the contamination deposition on the specimen surface during SEM imaging. Using this holder, the specimen can be heated up to 300°C inside the SEM. Images 1 to 4 in Fig. 1 are the secondary electron images showing the cone-shaped deposition of contamination on a platinum-coated carbon film at different heating temperatures. This platinum-coated film, which had been kept in wet and oily atmosphere for several weeks to insure it was well covered with hydro carbon gas molecules, was irradiated by an electron probe in a spot mode for 30sec. with 1×10−11 Amp. of probe current at 20kV. After the electron probe irradiation, the platinum-coated carbon film was tilted 45° for imaging. Image 1 in Fig. 1 shows the cone-shaped deposition of contamination when the specimen was not heated. Image 2 was at 35°C, Image 3 was at 55°C, and Image 4 in Fig. 1 was at 115°C. At higher than 120°C specimen heating temperature, the cone-shaped deposition of contamination could not be observed any more. On the other hand, we can heat up the specimen outside the SEM before we put the specimen into the SEM. Image 5 in Fig. 1 shows the results of specimen heating by a hair dryer. The same platinum- coated carbon film was heated by a hair dryer for 1 minute before it was intro- duced into the SEM, and was irradiated by the electron probe for 15, 30, and 45sec. in a spot mode. This 1 min. heating by a hair dryer shows almost same result as 55°C specimen heating in the SEM.


1994 ◽  
Vol 37 (6) ◽  
pp. 710-713
Author(s):  
Yu. A. Novikov ◽  
A. V. Rakov ◽  
I. Yu. Stekolin ◽  
I. B. Strizhkov

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