COMPARISON OF SECONDARY ION MASS SPECTROMETRY (SIMS) WITH ELECTRON MICROPROBE ANALYSIS (EPMA) AND OTHER THIN FILM ANALYTICAL METHODS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984225 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-103-C2-113

Author(s):

H. W. Werner ◽

A. P. von Rosenstiel

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Electron Microprobe ◽

Analytical Methods ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Characterization Of Ti In-Diffused Waveguides Using Secondary Ion Mass Spectrometry (SIMS) And Electron Microprobe Analysis (EMPA)

10.1117/12.937203 ◽

1987 ◽

Author(s):

E. A. Leone ◽

A. J. Signorelli ◽

S. Sriram ◽

P. Vohralik

Keyword(s):

Mass Spectrometry ◽

Electron Microprobe ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Cellular and subcellular localization of chromium in the crab Liocarcinus puber (Brachyrhyncha) by transmission electron microscopy, secondary ion mass spectrometry and electron microprobe analysis

BioMetals ◽

10.1007/bf00143384 ◽

1995 ◽

Vol 8 (3) ◽

Author(s):

Colette Chassard-Bouchaud ◽

Michelle Hubert ◽

Fran�oise Escaig ◽

Ren�Louis Inglebert

Keyword(s):

Electron Microscopy ◽

Mass Spectrometry ◽

Transmission Electron Microscopy ◽

Subcellular Localization ◽

Electron Microprobe ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

Transmission Electron ◽

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An electron microprobe analysis, secondary ion mass spectrometry, and single-crystal X-ray diffraction study of phlogopites from Mt. Vulture, Potenza, Italy: Consideration of cation partitioning

American Mineralogist ◽

10.2138/am.2006.1882 ◽

2006 ◽

Vol 91 (1) ◽

pp. 182-190 ◽

Author(s):

Ernesto Mesto ◽

Emanuela Schingaro ◽

Fernando Scordari ◽

Luisa Ottolini

Keyword(s):

Mass Spectrometry ◽

Single Crystal ◽

Diffraction Study ◽

Electron Microprobe ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

X Ray Diffraction ◽

X Ray ◽

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High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

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Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

International Journal of Precision Engineering and Manufacturing-Green Technology ◽

10.1007/s40684-019-00169-3 ◽

2019 ◽

Vol 7 (2) ◽

pp. 405-410

Author(s):

Kiho Bae ◽

Dong Young Jang ◽

Joong Sun Park ◽

Ji-Won Son ◽

Fritz B. Prinz ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Direct Measurement ◽

Secondary Ion Mass Spectrometry ◽

Oxide Thin Film ◽

Isotope Tracers ◽

Ion Mass Spectrometry ◽

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Time-of-flight secondary ion mass spectrometry study of lithium intercalation process in LiCoO2 thin film

Journal of Power Sources ◽

10.1016/j.jpowsour.2016.04.084 ◽

2016 ◽

Vol 321 ◽

pp. 241-247 ◽

Author(s):

C. Dellen ◽

H.-G. Gehrke ◽

S. Möller ◽

C.-L. Tsai ◽

U. Breuer ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lithium Intercalation ◽

Intercalation Process ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

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The Application of Nuclear Microprobe Analysis and Secondary Ion Mass Spectrometry to Radioactive Waste Disposal Studies

Mineralogical Magazine ◽

10.1180/minmag.1994.58a.1.45 ◽

1994 ◽

Vol 58A (1) ◽

pp. 81-82

Author(s):

J. A. Berry

Keyword(s):

Mass Spectrometry ◽

Radioactive Waste ◽

Waste Disposal ◽

Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

Radioactive Waste Disposal ◽

Nuclear Microprobe ◽

Ion Mass Spectrometry ◽

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Secondary Ion Mass Spectrometry and Its Application in Thin Film and Surface Layer Research

Japanese Journal of Applied Physics ◽

10.7567/jjaps.2s1.367 ◽

1974 ◽

Vol 13 (S1) ◽

pp. 367 ◽

Author(s):

H. W. Werner

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Surface Layer ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Analysis of layered AlxGa1 − xAs on gallium arsenide by electron microprobe and secondary-ion mass spectrometry

Analytica Chimica Acta ◽

10.1016/s0003-2670(00)85661-5 ◽

1987 ◽

Vol 195 ◽

pp. 193-200 ◽

Author(s):

M. Moens ◽

H. Nullens ◽

F. Adams

Keyword(s):

Mass Spectrometry ◽

Gallium Arsenide ◽

Electron Microprobe ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

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Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.

Journal of the Magnetics Society of Japan ◽

10.3379/jmsjmag.19.56 ◽

1995 ◽

Vol 19 (1) ◽

pp. 56-60 ◽

Author(s):

T. Amemiya ◽

N. Yoshino ◽

Y. Umeda ◽

Y. Nihei

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Magnetic Recording ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lubricant Film ◽

Ion Mass Spectrometry ◽

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