High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Hyun-Chang Shin; Joon-Tae Song

doi:10.1007/s13391-011-0916-y

High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Cited By ~ 5

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-flight secondary ion mass spectrometry study of lithium intercalation process in LiCoO2 thin film

Journal of Power Sources ◽

10.1016/j.jpowsour.2016.04.084 ◽

2016 ◽

Vol 321 ◽

pp. 241-247 ◽

Cited By ~ 10

Author(s):

C. Dellen ◽

H.-G. Gehrke ◽

S. Möller ◽

C.-L. Tsai ◽

U. Breuer ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lithium Intercalation ◽

Intercalation Process ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface analysis of pyrite in the No. 9 coal seam, Wuda Coalfield, Inner Mongolia, China, using high-resolution time-of-flight secondary ion mass-spectrometry

International Journal of Coal Geology ◽

10.1016/s0166-5162(03)00109-5 ◽

2003 ◽

Vol 55 (2-4) ◽

pp. 139-150 ◽

Cited By ~ 60

Author(s):

Shifeng Dai ◽

Xiaoqiang Hou ◽

Deyi Ren ◽

Yuegang Tang

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Coal Seam ◽

Surface Analysis ◽

Inner Mongolia ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Secondary Ion

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High-Resolution Epifluorescence and Time-of-Flight Secondary Ion Mass Spectrometry Chemical Imaging Comparisons of Single DNA Microarray Spots

Analytical Chemistry ◽

10.1021/ac3019334 ◽

2012 ◽

Vol 84 (24) ◽

pp. 10628-10636 ◽

Cited By ~ 17

Author(s):

Archana N. Rao ◽

Nicolas Vandencasteele ◽

Lara J. Gamble ◽

David W. Grainger

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Dna Microarray ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Chemical Imaging ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of a Lubricant Film in a Wearing Region on a Thin-Film Magnetic Recording Disk by Time-of-Flight Secondary Ion Mass Spectrometry.

Journal of the Magnetics Society of Japan ◽

10.3379/jmsjmag.19.56 ◽

1995 ◽

Vol 19 (1) ◽

pp. 56-60 ◽

Cited By ~ 1

Author(s):

T. Amemiya ◽

N. Yoshino ◽

Y. Umeda ◽

Y. Nihei

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Magnetic Recording ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lubricant Film ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Mechanisms of enhanced lithium intercalation into thin film V 2 O 5 in ionic liquids investigated by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Power Sources ◽

10.1016/j.jpowsour.2017.08.003 ◽

2017 ◽

Vol 364 ◽

pp. 61-71 ◽

Cited By ~ 1

Author(s):

Luis Santos ◽

Jolanta Światowska ◽

Virginie Lair ◽

Sandrine Zanna ◽

Antoine Seyeux ◽

...

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Ionic Liquids ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Lithium Intercalation ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Investigation of the Surface Chemical Structure of Some Biomedical Poly(amidoamine)s Using High-Resolution X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Macromolecules ◽

10.1021/ma00128a041 ◽

1995 ◽

Vol 28 (24) ◽

pp. 8259-8271 ◽

Cited By ~ 10

Author(s):

A. G. Shard ◽

L. Sartore ◽

M. C. Davies ◽

P. Ferruti ◽

A. J. Paul ◽

...

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Photoelectron Spectroscopy ◽

Chemical Structure ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Surface Chemical ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface Properties of Poly(3-hydroxybutyrate-co-3- hydroxyvalerate) Banded Spherulites Studied by Atomic Force Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir ◽

10.1021/la034865c ◽

2003 ◽

Vol 19 (18) ◽

pp. 7417-7422 ◽

Cited By ~ 27

Author(s):

Yong Jiang ◽

Jian-Jun Zhou ◽

Lin Li ◽

Jun Xu ◽

Bao-Hua Guo ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Surface Properties ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Banded Spherulites ◽

Secondary Ion

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Surface and trace analysis by high‐resolution time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576009 ◽

1989 ◽

Vol 7 (3) ◽

pp. 1823-1828 ◽

Cited By ~ 25

Author(s):

E. Niehuis ◽

T. Heller ◽

U. Jürgens ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

High Resolution ◽

Trace Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Analysis of surface contaminants on gallium arsenide and silicon by high-resolution time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.584777 ◽

1989 ◽

Vol 7 (3) ◽

pp. 512 ◽

Cited By ~ 20

Author(s):

E. Niehuis

Keyword(s):

Mass Spectrometry ◽

Gallium Arsenide ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Resolution Time ◽

Surface Contaminants ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199907)27:7<659::aid-sia557>3.0.co;2-g ◽

1999 ◽

Vol 27 (7) ◽

pp. 659-669 ◽

Cited By ~ 2

Author(s):

Keyang Xu ◽

Arkady I. Gusev ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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