scholarly journals AES, XPS AND TEM CHARACTERIZATION OF BORON NITRIDE DEPOSITED UNDER CHEMICAL VAPOR INFILTRATION (CVI) CONDITIONS

1989 ◽  
Vol 50 (C5) ◽  
pp. C5-333-C5-341 ◽  
Author(s):  
O. DUGNE ◽  
S. PROUHET ◽  
A. GUETTE ◽  
R. NASLAIN ◽  
R. FOURMEAUX ◽  
...  
2019 ◽  
Vol 45 (4) ◽  
pp. 4335-4341 ◽  
Author(s):  
Peng Xiao ◽  
Zeyan Liu ◽  
Zhi Chao Li ◽  
Bengu Zhang ◽  
Zhuan Li ◽  
...  

Author(s):  
Yongsheng Liu ◽  
Laifei Cheng ◽  
Litong Zhang ◽  
Yongdong Xu ◽  
Yi Liu

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