Procédures, méthodes et résultats de la métallographie non-destructive

1984 ◽  
Vol 72 (8-9) ◽  
pp. 339-343
Author(s):  
René Hoeg ◽  
Lars Taarnskov
Keyword(s):  
Non Destructive

Luminescence from individual dislocations in II-VI and III-V semiconductors

1991 ◽  
Vol 49 ◽  
pp. 834-835
Author(s):  
J W Steeds
Keyword(s):  
Group Iv ◽  
Luminescence Properties ◽  
Carrier Recombination ◽  
Transmission Electron ◽  
Wide Range ◽  
Basic Physics ◽  
Semiconducting Compounds ◽  
Diamond Group ◽  
Non Destructive ◽  
Technological Significance

There is a wide range of experimental results related to dislocations in diamond, group IV, II-VI, III-V semiconducting compounds, but few of these come from isolated, well-characterized individual dislocations. We are here concerned with only those results obtained in a transmission electron microscope so that the dislocations responsible were individually imaged. The luminescence properties of the dislocations were studied by cathodoluminescence performed at low temperatures (~30K) achieved by liquid helium cooling. Both spectra and monochromatic cathodoluminescence images have been obtained, in some cases as a function of temperature.There are two aspects of this work. One is mainly of technological significance. By understanding the luminescence properties of dislocations in epitaxial structures, future non-destructive evaluation will be enhanced. The second aim is to arrive at a good detailed understanding of the basic physics associated with carrier recombination near dislocations as revealed by local luminescence properties.

Forensic Identifications Aided by Scanning Electron Microscopy of Silicone-Epoxy Microreplicas of Calcified and Cornified Structures

1975 ◽  
Vol 33 ◽  
pp. 678-679 ◽  
Author(s):  
R.F. Sognnaes
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Forensic Science ◽  
George Washington ◽  
Epithelial Surface ◽  
Extended Application ◽  
Tissue Surfaces ◽  
Non Destructive ◽  
Scanning Electron ◽  
Surface Changes

Sufficient experience has been gained during the past five years to suggest an extended application of microreplication and scanning electron microscopy to problems of forensic science. The author's research was originally initiated with a view to develop a non-destructive method for identification of materials that went into objects of art, notably ivory and ivories. This was followed by a very specific application to the identification and duplication of the kinds of materials from animal teeth and tusks which two centuries ago went into the fabrication of the ivory dentures of George Washington. Subsequently it became apparent that a similar method of microreplication and SEM examination offered promise for a whole series of problems pertinent to art, technology and science. Furthermore, what began primarily as an application to solid substances has turned out to be similarly applicable to soft tissue surfaces such as mucous membranes and skin, even in cases of acute, chronic and precancerous epithelial surface changes, and to post-mortem identification of specific structures pertinent to forensic science.

Non destructive testing of works of art by terahertz analysis

2013 ◽  
Vol 64 (2) ◽  
pp. 21001 ◽  
Author(s):  
Jean-Luc Bodnar ◽  
Jean-Jacques Metayer ◽  
Kamel Mouhoubi ◽  
Vincent Detalle
Keyword(s):  
Non Destructive Testing ◽  
Destructive Testing ◽  
Works Of Art ◽  
Non Destructive

Analyse non destructive d’objets métalliques anciens

1953 ◽  
Vol 50 (2) ◽  
pp. 136-138 ◽  
Author(s):  
Georges Ambrosino ◽  
Pierre Pindrus
Keyword(s):  
Non Destructive

Inspection non destructive en ligne de la totalité de la surface des brames de coulée continue

1993 ◽  
Vol 90 (6) ◽  
pp. 823-828
Author(s):  
M. Mayos ◽  
J.M. Turón ◽  
P. Alexandre ◽  
J.L. Salon ◽  
M. Depeyris ◽  
...  
Keyword(s):  
Non Destructive

Remote diagnostics of vibrations of dynamic objects by Doppler microwave sensors

Metrologiya ◽  
2020 ◽  
pp. 25-42
Author(s):  
Dmitrii V. Khablov
Keyword(s):  
Intelligent Systems ◽  
Electromagnetic Waves ◽  
Continuous Monitoring ◽  
Phase Changes ◽  
Vibration Diagnostics ◽  
Remote Diagnostics ◽  
Active Vibration ◽  
Dynamic Objects ◽  
Microwave Sensors ◽  
Non Destructive

This paper describes a promising method for non-contact vibration diagnostics based on the use of Doppler microwave sensors. In this case, active irradiation of the object with electromagnetic waves and the allocation of phase changes using two-channel quadrature processing of the received reflected signal are used. The modes of further fine analysis of the resulting signal using spectral or wavelet transformations depending on the nature of the active vibration are considered. The advantages of this non-contact and remote vibration analysis method for the study of complex dynamic objects are described. The convenience of the method for machine learning and use in intelligent systems of non-destructive continuous monitoring of the state of these objects by vibration is noted.

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