Statistical analysis of the thickness variations in coils of packaging steel

2001 ◽  
Vol 98 (10) ◽  
pp. 873-879 ◽  
Author(s):  
Ph. Hollebeke
Keyword(s):  
Statistical Analysis ◽  
Thickness Variations

Statistical analysis of classification

1966 ◽  
Vol 24 ◽  
pp. 188-189
Author(s):  
T. J. Deeming
Keyword(s):  
Multivariate Analysis ◽  
Statistical Analysis ◽  
Classification Scheme ◽  
Analytical Procedure ◽  
Narrow Band ◽  
Scientific Research ◽  
Maximum Amount ◽  
Amount Of Information

If we make a set of measurements, such as narrow-band or multicolour photo-electric measurements, which are designed to improve a scheme of classification, and in particular if they are designed to extend the number of dimensions of classification, i.e. the number of classification parameters, then some important problems of analytical procedure arise. First, it is important not to reproduce the errors of the classification scheme which we are trying to improve. Second, when trying to extend the number of dimensions of classification we have little or nothing with which to test the validity of the new parameters.Problems similar to these have occurred in other areas of scientific research (notably psychology and education) and the branch of Statistics called Multivariate Analysis has been developed to deal with them. The techniques of this subject are largely unknown to astronomers, but, if carefully applied, they should at the very least ensure that the astronomer gets the maximum amount of information out of his data and does not waste his time looking for information which is not there. More optimistically, these techniques are potentially capable of indicating the number of classification parameters necessary and giving specific formulas for computing them, as well as pinpointing those particular measurements which are most crucial for determining the classification parameters.

Effects of Vibration on the Preparation of Ultrathin Sections

1973 ◽  
Vol 31 ◽  
pp. 358-359
Author(s):  
Joseph M. Blum ◽  
Edward P. Gargiulo ◽  
J. R. Sawers
Keyword(s):  
Cutting Speed ◽  
Ground Level ◽  
Environmental Vibration ◽  
Block Face ◽  
Ultrathin Sections ◽  
Embedding Medium ◽  
Thickness Variations ◽  
Building Walls ◽  
Cutting Direction ◽  
Diamond Knife

It is now well-known that chatter (Figure 1) is caused by vibration between the microtome arm and the diamond knife. It is usually observed as a cyclical variation in “optical” density of an electron micrograph due to sample thickness variations perpendicular to the cutting direction. This vibration might be induced by using too large a block face, too large a clearance angle, excessive cutting speed, non-uniform embedding medium or microtome vibration. Another prominent cause is environmental vibration caused by inadequate building construction. Microtomes should be installed on firm, solid floors. The best floors are thick, ground-level concrete pads poured over a sand bed and isolated from the building walls. Even when these precautions are followed, we recommend an additional isolation pad placed on the top of a sturdy table.

Various technic for the measurement of step thickness on crystal surfaces

1978 ◽  
Vol 36 (1) ◽  
pp. 438-439
Author(s):  
C. Boulesteix ◽  
C. Colliex ◽  
C. Mory ◽  
B. Pardo ◽  
D. Renard
Keyword(s):  
Critical Thickness ◽  
Symmetric Case ◽  
Transmitted Intensity ◽  
Crystal Surfaces ◽  
Bright Field ◽  
Excited Wave ◽  
Highly Sensitive ◽  
Contrast Mechanisms ◽  
Step Thickness ◽  
Thickness Variations

Contrast mechanisms, which are responsible of the various types of image formation, are generally thickness dependant. In the following, two imaging modes in the 100 kV CTEM are described : they are highly sensitive to thickness variations and can be used for quantitative estimations of step heights.Detailed calculations (1) of the bright-field intensity have been carried out in the 3 (or 2N+l)-beam symmetric case. They show that in given conditions, the two important symmetric Bloch waves interfere most strongly at a critical thickness for which they have equal emergent amplitudes (the more excited wave at the entrance surface is also the more absorbed). The transmitted intensity I for a Nd2O3 specimen has been calculated as a function of thickness t. The capacity of the method to detect a step and measure its height can be more clearly deduced from a plot of dl/Idt as shown in fig. 1.

Quantitative parallel EELS spectrum imaging developed as a new tool in AEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1202-1203
Author(s):  
Gianluigi Botton ◽  
Gilles L'espérance
Keyword(s):  
Statistical Analysis ◽  
Spatial Resolution ◽  
Personal Computer ◽  
Systematic Study ◽  
Present Author ◽  
Chemical Elements ◽  
Detection Limits ◽  
Research Groups ◽  
Quantitative Performance ◽  
Spectrum Imaging

As interest for parallel EELS spectrum imaging grows in laboratories equipped with commercial spectrometers, different approaches were used in recent years by a few research groups in the development of the technique of spectrum imaging as reported in the literature. Either by controlling, with a personal computer both the microsope and the spectrometer or using more powerful workstations interfaced to conventional multichannel analysers with commercially available programs to control the microscope and the spectrometer, spectrum images can now be obtained. Work on the limits of the technique, in terms of the quantitative performance was reported, however, by the present author where a systematic study of artifacts detection limits, statistical errors as a function of desired spatial resolution and range of chemical elements to be studied in a map was carried out The aim of the present paper is to show an application of quantitative parallel EELS spectrum imaging where statistical analysis is performed at each pixel and interpretation is carried out using criteria established from the statistical analysis and variations in composition are analyzed with the help of information retreived from t/γ maps so that artifacts are avoided.

Intraindividual Variability in Development Within and Between Individuals

2001 ◽  
Vol 6 (3) ◽  
pp. 187-193 ◽  
Author(s):  
John R. Nesselroade
Keyword(s):  
Statistical Analysis ◽  
Research Design ◽  
Intraindividual Variability ◽  
Factor Analytic

A focus on the study of development and other kinds of changes in the whole individual has been one of the hallmarks of research by Magnusson and his colleagues. A number of different approaches emphasize this individual focus in their respective ways. This presentation focuses on intraindividual variability stemming from Cattell's P-technique factor analytic proposals, making several refinements to make it more tractable from a research design standpoint and more appropriate from a statistical analysis perspective. The associated methods make it possible to study intraindividual variability both within and between individuals. An empirical example is used to illustrate the procedure.

Review of Basic FORTRAN for Statistical Analysis.

1967 ◽  
Vol 12 (9) ◽  
pp. 467-467
Author(s):  
JOHN C. LOEHLIN
Keyword(s):  
Statistical Analysis
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