Nanometer-scale dielectric constant of Ge quantum dots using apertureless near-field scanning optical microscopy

2010 ◽  
Vol 96 (6) ◽  
pp. 063107 ◽  
Author(s):  
Y. Ogawa ◽  
F. Minami ◽  
Yohannes Abate ◽  
Stephen R. Leone
Keyword(s):  
Quantum Dots ◽  
Dielectric Constant ◽  
Optical Microscopy ◽  
Near Field ◽  
Nanometer Scale ◽  
Ge Quantum Dots ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Measurement of Strain Associated with Defects in SiTiO3 Bicrystals using Near-Field Scanning Optical Microscopy

1997 ◽  
Vol 474 ◽  
Author(s):  
E. B. McDaniel ◽  
J. W. P. Hsu
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Optical Microscope ◽  
Nanometer Scale ◽  
Polarization Modulation ◽  
Reflection Symmetry ◽  
Strain Fields ◽  
Modulation Technique ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTWe incorporate a polarization modulation technique in a near-field scanning optical microscope (NSOM) for quantitative polarimetry studies at the nanometer scale. Using this technique, we map out stress-induced birefringence associated with submicron defects at the fusion boundaries of SiTiO3 bicrystals. The strain fields surrounding these defects are larger than the defect sizes and show complex spiral shapes that break the reflection symmetry of the bicrystal boundary.

Enhanced Emission from Single Isolated Gold Quantum Dots Investigated Using Two-Photon-Excited Fluorescence Near-Field Scanning Optical Microscopy

2016 ◽  
Vol 138 (50) ◽  
pp. 16299-16307 ◽  
Author(s):  
Neranga Abeyasinghe ◽  
Santosh Kumar ◽  
Kai Sun ◽  
John F. Mansfield ◽  
Rongchao Jin ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Optical Microscopy ◽  
Near Field ◽  
Two Photon ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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