Observation of nanometer-scale crystal grain orientation in ferroelectric thin films using polarization near-field scanning optical microscopy (NSOM)
2001 ◽
Vol 62
(9-10)
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pp. 1643-1655
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Keyword(s):
2001 ◽
Vol 116
(1-3)
◽
pp. 333-337
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Keyword(s):
2011 ◽
Keyword(s):
2001 ◽
Vol 202
(1)
◽
pp. 241-243
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Keyword(s):