Reflection high-energy electron diffraction intensity oscillation during layer-by-layer oxidation of Si(001) surfaces

1999 ◽  
Vol 74 (22) ◽  
pp. 3284-3286 ◽  
Author(s):  
Heiji Watanabe ◽  
Toshio Baba ◽  
Masakazu Ichikawa
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