Fast neutron radiography and trace element analysis: New application of electron cyclotron resonance ion sources (abstract)

2002 ◽  
Vol 73 (2) ◽  
pp. 937-937
Author(s):  
T. Nakagawa ◽  
M. Kidera ◽  
Y. Higurashi ◽  
M. Kase ◽  
Y. Yano
Keyword(s):  
Trace Element ◽  
Fast Neutron ◽  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Neutron Radiography ◽  
Trace Element Analysis ◽  
Electron Cyclotron ◽  
Ion Sources ◽  
Element Analysis ◽  
Fast Neutron Radiography

LINEAR ACCELERATOR MASS SPECTROMETRY WITH PIXE CALIBRATION

2005 ◽  
Vol 15 (01n02) ◽  
pp. 11-17
Author(s):  
SHINTARO UEDA ◽  
TOSHIYUKI HATTORI ◽  
NORIYOSU HAYASHIZAKI ◽  
TOSHIKI HATA ◽  
KATUNORI KAWASAKI ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Trace Element ◽  
Cyclotron Resonance ◽  
Linear Accelerator ◽  
Electron Cyclotron Resonance ◽  
Trace Element Analysis ◽  
Ion Source ◽  
Element Analysis ◽  
Pixe Analysis ◽  
Calibration Methods

AMS is commonly used in radioisotope analysis because it can detect isotopes down to levels of 10-15 by abundance, but applications for trace element analysis are few. Therefore, we propose a new kind of AMS for trace element analysis using a linear accelerator (LINAC), an Electron Cyclotron Resonance Ion Source (ECRIS), and calibration methods with PIXE analysis. Abundance ratios of each element measured by PIXE are applied to create distribution charts of particles and charge states, and these charts are used for quantitative analysis. We report the concepts behind our AMS and calibration methods in this paper.

Plasma ion dynamics and beam formation in electron cyclotron resonance ion sources

2010 ◽  
Vol 81 (2) ◽  
pp. 02A334 ◽  
Author(s):  
D. Mascali ◽  
L. Neri ◽  
S. Gammino ◽  
L. Celona ◽  
G. Ciavola ◽  
...  
Keyword(s):  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Electron Cyclotron ◽  
Ion Sources ◽  
Ion Dynamics ◽  
Beam Formation
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