Atomic force microscopy study of surface roughening of sputter-deposited TiN thin films

2002 ◽  
Vol 92 (7) ◽  
pp. 3559-3563 ◽  
Author(s):  
Z.-J. Liu ◽  
N. Jiang ◽  
Y. G. Shen ◽  
Y.-W. Mai
Langmuir ◽  
2013 ◽  
Vol 29 (7) ◽  
pp. 2339-2349 ◽  
Author(s):  
Michail Kalloudis ◽  
Emmanouil Glynos ◽  
Stergios Pispas ◽  
John Walker ◽  
Vasileios Koutsos

2009 ◽  
Vol 182 ◽  
pp. 012015 ◽  
Author(s):  
T Ristoiu ◽  
T Petrisor ◽  
M S Gabor ◽  
M Nasui ◽  
B Mos ◽  
...  

Author(s):  
C. E. Vallet ◽  
C. S. Prouteau ◽  
R. Feenstra ◽  
J. F. Hamet ◽  
D. T. Verebelyi ◽  
...  

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