Formation of Very Thin Oxide Films on Metals: Contact Potential Measurements during the Oxidation of (100) Cu

1970 ◽  
Vol 53 (9) ◽  
pp. 3544-3548 ◽  
Author(s):  
Joseph E. Boggio
Keyword(s):  
Oxide Films ◽  
Contact Potential ◽  
Thin Oxide Films ◽  
Thin Oxide

scholarly journals Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

2011 ◽  
Vol 2 ◽  
pp. 1-14 ◽  
Author(s):  
Thomas König ◽  
Georg H Simon ◽  
Lars Heinke ◽  
Leonid Lichtenstein ◽  
Markus Heyde
Keyword(s):  
Electronic Structure ◽  
Aluminum Oxide ◽  
Magnesium Oxide ◽  
Oxide Films ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Contact Potential ◽  
Thin Oxide Films ◽  
Line Defects ◽  
Thin Oxide

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The contact potential was determined by Kelvin probe force microscopy (KPFM) and the electronic structure by scanning tunneling spectroscopy (STS). On magnesium oxide, different color centers, i.e., F0, F+, F2+ and divacancies, have different effects on the contact potential. These differences enabled classification and unambiguous differentiation by KPFM. True atomic resolution shows the topography at line defects in aluminum oxide. At these domain boundaries, STS and KPFM verify F2+-like centers, which have been predicted by density functional theory calculations. Thus, by determining the contact potential and the electronic structure with a spatial resolution in the nanometer range, NC-AFM and STM can be successfully applied on thin oxide films beyond imaging the topography of the surface atoms.

Surface Potential Control on Thin Oxide Films with Respect to Electron Stimulated Desorption Studies

1995 ◽  
Vol 5 (9) ◽  
pp. 1407-1424 ◽  
Author(s):  
Marc Bernheim ◽  
Gilles Rousse
Keyword(s):  
Surface Potential ◽  
Oxide Films ◽  
Potential Control ◽  
Thin Oxide Films ◽  
Thin Oxide ◽  
Electron Stimulated Desorption

Electron currents in thin oxide films on aluminium

Vacuum ◽  
1953 ◽  
Vol 3 (4) ◽  
pp. 449
Keyword(s):  
Oxide Films ◽  
Thin Oxide Films ◽  
Thin Oxide

X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins

1989 ◽  
pp. 303-310
Author(s):  
T. Paul Adl ◽  
H. F. Stehmeyer
Keyword(s):  
Oxide Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Oxide Films ◽  
Thin Oxide

Conductance measurement of thin oxide films on a platinum anode

1977 ◽  
Vol 22 (2) ◽  
pp. 175-179 ◽  
Author(s):  
S. Shibata
Keyword(s):  
Oxide Films ◽  
Conductance Measurement ◽  
Platinum Anode ◽  
Thin Oxide Films ◽  
Thin Oxide

Cover Picture: Photoinduced Formation of Wrinkled Microstructures with Long-Range Order in Thin Oxide Films (Adv. Mater. 24/2007)

2007 ◽  
Vol 19 (24) ◽  
pp. NA-NA
Author(s):  
M. Takahashi ◽  
T. Maeda ◽  
K. Uemura ◽  
J. Yao ◽  
Y. Tokuda ◽  
...  
Keyword(s):  
Long Range ◽  
Oxide Films ◽  
Range Order ◽  
Long Range Order ◽  
Thin Oxide Films ◽  
Thin Oxide

Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond

2009 ◽  
pp. 143-167
Author(s):  
M. Heyde ◽  
G. H. Simon ◽  
T. König
Keyword(s):  
Oxide Films ◽  
Thin Oxide Films ◽  
Thin Oxide
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