Direct comparison between phase locked oscillator and direct resonance oscillator in the noncontact atomic force microscopy under ultrahigh vacuum

Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

Review of Scientific Instruments ◽

10.1063/1.1148838 ◽

1998 ◽

Vol 69 (4) ◽

pp. 1757-1764 ◽

Cited By ~ 41

Author(s):

M. A. Lantz ◽

S. J. O’Shea ◽

M. E. Welland

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Force Microscopy ◽

Observation of the Creation and Annihilation of Local Current Paths in HfO2Thin Films on Pt by Ultrahigh-Vacuum Conductive Atomic Force Microscopy: Evidence of Oxygen Spill Over during the Forming Process

10.1143/jjap.48.060202 ◽

2009 ◽

Vol 48 (6) ◽

pp. 060202 ◽

Cited By ~ 10

Author(s):

Naotaka Sasaki ◽

Koji Kita ◽

Akira Toriumi ◽

Kentaro Kyuno

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Forming Process ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Local Current ◽

The Creation

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

High-resolution imaging of single-stranded DNA on mica surface under ultrahigh vacuum conditions by noncontact atomic force microscopy

10.1116/1.590853 ◽

1999 ◽

Vol 17 (5) ◽

pp. 1941 ◽

Cited By ~ 5

Author(s):

Takuya Matsumoto ◽

Yasushi Maeda ◽

Yasuhisa Naitoh ◽

Tomoji Kawai

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Ultrahigh Vacuum ◽

High Resolution Imaging ◽

Mica Surface ◽

Single Stranded Dna ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy

10.1143/jjap.34.l145 ◽

1995 ◽

Vol 34 (Part 2, No. 1B) ◽

pp. L145-L148 ◽

Cited By ~ 250

Author(s):

Shin-ichi Kitamura ◽

Masashi Iwatsuki

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Force Microscopy ◽

Time- and Temperature-Dependent Growth Behavior of Ionic Liquids on Au(111) Studied by Atomic Force Microscopy in Ultrahigh Vacuum

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c06613 ◽

2021 ◽

Vol 125 (37) ◽

pp. 20439-20449

Author(s):

Manuel Meusel ◽

Afra Gezmis ◽

Simon Jaekel ◽

Matthias Lexow ◽

Andreas Bayer ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquids ◽

Ultrahigh Vacuum ◽

Growth Behavior ◽

Temperature Dependent ◽

Force Microscopy ◽

Atomic Force ◽

Dependent Growth

Growth of Multilayers of Ionic Liquids on Au(111) Investigated by Atomic Force Microscopy in Ultrahigh Vacuum

Langmuir ◽

10.1021/acs.langmuir.0c02596 ◽

2020 ◽

Vol 36 (45) ◽

pp. 13670-13681

Author(s):

Manuel Meusel ◽

Matthias Lexow ◽

Afra Gezmis ◽

Andreas Bayer ◽

Florian Maier ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquids ◽

Ultrahigh Vacuum ◽

Force Microscopy ◽

Atomic Force Microscopy in Ultrahigh Vacuum

10.1143/jjap.33.3726 ◽

1994 ◽

Vol 33 (Part 1, No. 6B) ◽

pp. 3726-3734 ◽

Cited By ~ 58

Author(s):

Franz Josef Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Force Microscopy ◽

Tip-Induced Surface Disorder on Hydrogen-Terminated Silicon(111) Surface Observed by Ultrahigh-Vacuum Atomic Force Microscopy

10.1143/jjap.33.3735 ◽

1994 ◽

Vol 33 (Part 1, No. 6B) ◽

pp. 3735-3738 ◽

Cited By ~ 2

Author(s):

Masami Kageshima ◽

Hirofumi Yamada ◽

Yukinori Morita ◽

Hiroshi Tokumoto ◽

Kan Nakayama ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Force Microscopy ◽

Atomic Force ◽

Surface Disorder

The study of electrical characteristics of heterojunction based on ZnO nanowires using ultrahigh-vacuum conducting atomic force microscopy

Applied Physics Letters ◽

10.1063/1.2821831 ◽

2007 ◽

Vol 91 (23) ◽

pp. 233105 ◽

Cited By ~ 48

Author(s):

J. H. He ◽

C. H. Ho

Keyword(s):

Atomic Force Microscopy ◽

Ultrahigh Vacuum ◽

Zno Nanowires ◽

Electrical Characteristics ◽

Force Microscopy ◽

Pulsed laser ultrahigh vacuum deposited silicon in the presence of excess cesium and oxygen studied with x-ray photoelectron spectroscopy and atomic force microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1577137 ◽

2003 ◽

Vol 21 (4) ◽

pp. 874-880 ◽

Cited By ~ 1

Author(s):

Cheow-Keong Choo ◽

Katsumi Tanaka ◽

Hiroaki Suzuki ◽

Nobuyuki Saotome ◽

Kouji Ichida

Keyword(s):

Atomic Force Microscopy ◽

Photoelectron Spectroscopy ◽

Pulsed Laser ◽

Ultrahigh Vacuum ◽

X Ray ◽

Force Microscopy ◽