High-resolution imaging of single-stranded DNA on mica surface under ultrahigh vacuum conditions by noncontact atomic force microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590853 ◽

1999 ◽

Vol 17 (5) ◽

pp. 1941 ◽

Author(s):

Takuya Matsumoto ◽

Yasushi Maeda ◽

Yasuhisa Naitoh ◽

Tomoji Kawai

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Ultrahigh Vacuum ◽

High Resolution Imaging ◽

Mica Surface ◽

Single Stranded Dna ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.49.08lb12 ◽

2010 ◽

Vol 49 (8) ◽

pp. 08LB12 ◽

Author(s):

Katsuyuki Suzuki ◽

Shin-ichi Kitamura ◽

Shukichi Tanaka ◽

Kei Kobayashi ◽

Hirofumi Yamada

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Frequency Modulation ◽

Liquid Interface ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging ◽

Solid Liquid Interface ◽

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High-resolution imaging of C60molecules using tuning-fork-based non-contact atomic force microscopy

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/24/8/084005 ◽

2012 ◽

Vol 24 (8) ◽

pp. 084005 ◽

Author(s):

R Pawlak ◽

S Kawai ◽

S Fremy ◽

T Glatzel ◽

E Meyer

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Tuning Fork ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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High Resolution Imaging of Starch Granule Surfaces by Atomic Force Microscopy

Journal of Cereal Science ◽

10.1006/jcrs.1998.0189 ◽

1998 ◽

Vol 27 (3) ◽

pp. 255-265 ◽

Author(s):

P.M. Baldwin ◽

J. Adler ◽

M.C. Davies ◽

C.D. Melia

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Starch Granule ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy

Biophysical Journal ◽

10.1016/s0006-3495(94)80649-6 ◽

1994 ◽

Vol 67 (4) ◽

pp. 1749-1753 ◽

Author(s):

C.A. Putman ◽

K.O. van der Werf ◽

B.G. de Grooth ◽

N.F. van Hulst ◽

J. Greve

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Living Cells ◽

High Resolution Imaging ◽

Tapping Mode ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging ◽

Mode Atomic Force Microscopy

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High-resolution imaging of solvation structures with amplitude-modulation atomic force microscopy

10.1117/12.905864 ◽

2012 ◽

Author(s):

Kislon Voïtchovsky ◽

Maria Ricci

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Amplitude Modulation ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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High-Resolution Imaging of Plasmid DNA in Liquids in Dynamic Mode Atomic Force Microscopy Using a Carbon Nanofiber Tip

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.08lb14 ◽

2011 ◽

Vol 50 (8S3) ◽

pp. 08LB14 ◽

Author(s):

Masashi Kitazawa ◽

Shuichi Ito ◽

Akira Yagi ◽

Nobuaki Sakai ◽

Yoshitugu Uekusa ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Plasmid Dna ◽

Carbon Nanofiber ◽

Dynamic Mode ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging ◽

Mode Atomic Force Microscopy

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High-resolution imaging of chromosome-related structures by atomic force microscopy

Journal of Microscopy ◽

10.1111/j.1365-2818.1992.tb03266.x ◽

1992 ◽

Vol 168 (3) ◽

pp. 239-247 ◽

Author(s):

Bart G. De Grooth ◽

Constant A. J. Putman

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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High resolution imaging for charged particles using CR-39 and atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(98)01030-4 ◽

1999 ◽

Vol 422 (1-3) ◽

pp. 751-755 ◽

Author(s):

H Takahashi ◽

K Amemiya ◽

Y Kaizuka ◽

M Nakazawa ◽

N Yasuda ◽

...

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Charged Particles ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Resolution Imaging

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Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces

Physical Chemistry Chemical Physics ◽

10.1039/b605828k ◽

2006 ◽

Vol 8 (33) ◽

pp. 3909 ◽

Author(s):

Phillip S. Dobson ◽

John M. R. Weaver ◽

David P. Burt ◽

Mark N. Holder ◽

Neil R. Wilson ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electron Beam ◽

High Resolution ◽

High Resolution Imaging ◽

Fabrication Method ◽

Force Microscopy ◽

Active Surfaces ◽

Atomic Force ◽

Resolution Imaging

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High-resolution Imaging of Starch Granule Structure using Atomic Force Microscopy

Starch - Stärke ◽

10.1002/1521-379x(200006)52:5<150::aid-star150>3.0.co;2-f ◽

2000 ◽

Vol 52 (5) ◽

pp. 150-153 ◽

Author(s):

Toshio Ohtani ◽

Tomoyuki Yoshino ◽

Shouji Hagiwara ◽

Takaaki Maekawa

Keyword(s):

Atomic Force Microscopy ◽

High Resolution ◽

Starch Granule ◽

High Resolution Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Granule Structure ◽

Resolution Imaging

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