Pseudoelasticity of martensitic titanium-nickel shape-memory films studied by in situ heating nanoindentation and transmission electron microscopy

2005 ◽  
Vol 87 (26) ◽  
pp. 263108 ◽  
Author(s):  
K. Komvopoulos ◽  
X.-G. Ma
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Shape Memory ◽  
Transmission Electron ◽  
Shape Memory Films ◽  
Titanium Nickel ◽  
In Situ Heating

In situ Transmission Electron Microscopy and Nanoindentation Studies of Phase Transformation and Pseudoelasticity of Shape-memory Titanium-nickel Films

2005 ◽  
Vol 20 (7) ◽  
pp. 1808-1813 ◽  
Author(s):  
X.-G. Ma ◽  
K. Komvopoulos
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformation ◽  
Shape Memory ◽  
Heating And Cooling ◽  
Transmission Electron ◽  
Different Temperatures ◽  
Titanium Nickel ◽  
In Situ Heating

Transmission electron microscopy (TEM) and nanoindentation, both with in situ heating capability, and electrical resistivity measurements were used to investigate phase transformation phenomena and thermomechanical behavior of shape-memory titanium-nickel (TiNi) films. The mechanisms responsible for phase transformation in the nearly equiatomic TiNi films were revealed by heating and cooling the samples inside the TEM vacuum chamber. Insight into the deformation behavior of the TiNi films was obtained from the nanoindentation response at different temperatures. A transition from elastic-plastic to pseudoelastic deformation of the martensitic TiNi films was encountered during indentation and heating. In contrast to the traditional belief, the martensitic TiNi films exhibited a pseudoelastic behavior during nanoindentation within a specific temperature range. This unexpected behavior is interpreted in terms of the evolution of martensitic variants and changes in the mobility of the twinned structures in the martensitic TiNi films, observed with the TEM during in situ heating.

Reversible phase transformations in a shape memory alloy In–Tl nanowires observed by in situ transmission electron microscopy

2012 ◽  
Vol 70 ◽  
pp. 109-112 ◽  
Author(s):  
Hongxing Zheng ◽  
Zhiping Luo ◽  
Dong Fang ◽  
Francis R. Phillips ◽  
Dimitris C. Lagoudas
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Shape Memory Alloy ◽  
Shape Memory ◽  
Phase Transformations ◽  
Transmission Electron ◽  
Reversible Phase

Structural Evolutions of Vertically Aligned Two-Dimensional MoS2 Layers Revealed by in Situ Heating Transmission Electron Microscopy

2019 ◽  
Vol 123 (45) ◽  
pp. 27843-27853 ◽  
Author(s):  
Mengjing Wang ◽  
Jung Han Kim ◽  
Sang Sub Han ◽  
Minyeong Je ◽  
Jaeyoung Gil ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Two Dimensional ◽  
Transmission Electron ◽  
Vertically Aligned ◽  
In Situ Heating

Microstructures of Polysilicon

1987 ◽  
Vol 106 ◽  
Author(s):  
R. Sinclair ◽  
A. H. Carim ◽  
J. Morgiel ◽  
J. C. Bravman
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Polycrystalline Silicon ◽  
Transmission Electron ◽  
Polysilicon Films ◽  
In Situ Heating ◽  
Phosphorus Doped ◽  
Microstructural Studies

ABSTRACTSome typical microstructural studies of polycrystalline silicon using transmission electron microscopy (TEM) are described, including the application of this material for assisting TEM investigations themselves. Examples include oxidation and realignment of polysilicon thin films, the structure of polysilicon in EEPROM devices, polysilicon in trench capacitors and measurement of SiO2 layer thicknesses with polysilicon overlayers. It is also shown tha grain growth in heavily phosphorus doped polysilicon films can be followed by in situ heating in the TEM.

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