Microstructures of Polysilicon
Keyword(s):
ABSTRACTSome typical microstructural studies of polycrystalline silicon using transmission electron microscopy (TEM) are described, including the application of this material for assisting TEM investigations themselves. Examples include oxidation and realignment of polysilicon thin films, the structure of polysilicon in EEPROM devices, polysilicon in trench capacitors and measurement of SiO2 layer thicknesses with polysilicon overlayers. It is also shown tha grain growth in heavily phosphorus doped polysilicon films can be followed by in situ heating in the TEM.
1990 ◽
Vol 48
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pp. 68-69
1989 ◽
Vol 37
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pp. 203-216
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2011 ◽
Vol 46
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pp. 4314-4317
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2005 ◽
Vol 20
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pp. 1808-1813
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2016 ◽
Vol 8
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pp. 14548-14551
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2013 ◽
Vol 1
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pp. 602-610
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