Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force

Reverse Engineering of an Affinity-Switchable Molecular Interaction Characterized by Atomic Force Microscopy Single-Molecule Force Spectroscopy†

Langmuir ◽  
2008 ◽  
Vol 24 (4) ◽  
pp. 1365-1370 ◽  
Author(s):  
Dario Anselmetti ◽  
Frank Wilco Bartels ◽  
Anke Becker ◽  
Björn Decker ◽  
Rainer Eckel ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Reverse Engineering ◽  
Single Molecule ◽  
Molecular Interaction ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Nanoscale localization of the near-surface nitrogen vacancy center assisted by a silicon atomic force microscopy probe

2021 ◽  
Vol 3 (1) ◽  
pp. 014003
Author(s):  
Xiangyu Ye ◽  
Mengqi Wang ◽  
Pengfei Wang ◽  
Rui Li ◽  
Maosen Guo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nitrogen Vacancy ◽  
Atomic Force Microscopy Probe ◽  
Near Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nitrogen Vacancy Center ◽  
Vacancy Center

Single molecule force spectroscopy on poly(vinyl alcohol) by atomic force microscopy

1998 ◽  
Vol 19 (12) ◽  
pp. 609-612 ◽  
Author(s):  
Hongbin Li ◽  
Wenke Zhang ◽  
Xi Zhang ◽  
Jiacong Shen ◽  
Bingbing Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Vinyl Alcohol ◽  
Force Spectroscopy ◽  
Poly Vinyl Alcohol ◽  
Single Molecule Force Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force

Going Vertical To Improve the Accuracy of Atomic Force Microscopy Based Single-Molecule Force Spectroscopy

ACS Nano ◽  
2017 ◽  
Vol 12 (1) ◽  
pp. 198-207 ◽  
Author(s):  
Robert Walder ◽  
William J. Van Patten ◽  
Ayush Adhikari ◽  
Thomas T. Perkins
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

Atomic Force Microscopy-Based Force Spectroscopy and Its Various Applications

2021 ◽  
pp. 585-603
Author(s):  
Jyoti Jaisawal ◽  
Amit Kumar Srivastav ◽  
Dheeraj K. Singh ◽  
Umesh Kumar
Keyword(s):  
Atomic Force Microscopy ◽  
Force Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force
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