Protective, chromate substitute thin layers on roughened galvanized surfaces produced at OCAS
(Arcelor, Belgium) were characterized and compared using Scanning Electron Microscopy
(SEM+EDS), Atomic Force Microscopy (AFM), Nanoindentation and X-ray Photoemission
Spectroscopy (XPS). EDX maps, line scans and point analyses obtained at various places of the
surfaces have shown differences between the CVD and silane nanolayers in the matter of thickness
distribution and composition. At cross-section specimens the thickness of the layers could be
shown. The hardness differences caused by layer thickness variations are hard to follow by
nanoindentation as the penetration depth of the indenter is much larger than the thickness of the
coatings. XPS measurements can distinguish between the chemical states of silicon in CVD and
silane coatings.