High frequency and noise model of gate-all-around metal-oxide-semiconductor field-effect transistors
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1988 ◽
Vol 6
(6)
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pp. 1740
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2005 ◽
Vol 44
(1A)
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pp. 38-43
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2012 ◽
Vol 51
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pp. 090111
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2000 ◽
Vol 39
(Part 1, No. 11)
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pp. 6115-6118
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2012 ◽
Vol 51
(2)
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pp. 02BC02
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